Review of Scientific Instruments, 2000, V 71, N 7.


Single crystal optic elements for helium atom microscopy D. A. MacLaren, W. Allison, and B. Holst pp. 2625-2634 Elliptical x-ray microprobe mirrors by differential deposition Gene E. Ice, Jin-Seok Chung, Jonathan Z. Tischler, Andrew Lunt, and Lahsen Assoufid pp. 2635-2639 A simple microbeam profiling technique for x-ray optics M. Lankosz and J. Sieber pp. 2640-2643 A simple high-resolution on-line x-ray imaging crystal spectrograph for laser-plasma interaction studies V. Arora, S. R. Kumbhare, P. A. Naik, and P. D. Gupta pp. 2644-2650 Extreme ultraviolet-vacuum ultraviolet spectrum detection using image plates A. Ben-Kish, A. Fisher, E. Cheifetz, and J. L. Schwob pp. 2651-2654 Doppler-free modulation transfer spectroscopy of rubidium 52S1/2-62P1/2 transitions using a frequency-doubled diode laser blue-light source Nobuhiko Ito pp. 2655-2662 Investigation of the propagation characteristics of excimer lasers using a Hartmann-Shack sensor Bernd Schäfer and Klaus Mann pp. 2663-2668 Michelson interferometry with 10 pm accuracy John Lawall and Ernest Kessler pp. 2669-2676 New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms Guo-Qiang Xia, Rong-Jun Zhang, Yu-Li Chen, Hai-Bing Zhao, Song-You Wang, Shi-Ming Zhou, Yu-Xiang Zheng, Yue-Mei Yang, Liang-Yao Chen, Jun-Hao Chu, and Zhi-Ming Wang pp. 2677-2683 Ultrasmall volume refractive index detection using microinterferometry Kelly Swinney, Dmitry Markov, and Darryl J. Bornhop pp. 2684-2692
Crystal adjustment by means of blocking pattern H. Ellmer, R. Aichinger, E. Winkler, D. Semrad, V. Mergel and O.Jagutzki pp. 2693-2697 High-energy neutral particle measurement system in the large helical device Tetsuo Ozaki, Vincenzo Zanza, Giovanni Bracco, Arturo Moleti, Benedetto Tilia, Alessandro Sibio, Shigeru Sudo, Hideya Nakanishi, Mamoru Kojima, and Mamoru Shoji , (G1/G2 Experimental Group ) pp. 2698-2703 Detection efficiency of a channel electron multiplier for low energy incident noble gas ions M. Tassotto and P. R. Watson pp. 2704-2709 A sensitive dispersion interferometer with high temporal resolution for electron density measurements Valentin Licht and Hansjoachim Bluhm pp. 2710-2715
Efficient multichannel Thomson scattering measurement system for diagnostics of low-temperature plasmas A. Kono and K. Nakatani pp. 2716-2721 Measurements of characteristic transients of planar electrostatic probes in cold plasmas J. P. Booth, N. St. J. Braithwaite, A. Goodyear, and P. Barroy pp. 2722-2727 Simple microwave preionization source for ohmic plasmas W. Choe, Gi-Chung Kwon, Junghee Kim, Jayhyun Kim, Sang-Jean Jeon, and Songwhe Huh pp. 2728-2732 Ion dynamics in the sheath in multicomponent plasma with negative ions Ram Prakash, A. Sarma, and Joyanti Chutia pp. 2733-2736
Monolithic sapphire parametric transducer operation at cryogenic temperatures C. R. Locke, M. E. Tobar, and E. N. Ivanov pp. 2737-2741
Subresolution axial distance measurements in far-field fluorescence microscopy with precision of 1 nanometer Michael Schmidt, Matthias Nagorni, and Stefan W. Hell pp. 2742-2745 Calibration of the torsional spring constant and the lateral photodiode response of frictional force microscopes Adam Feiler, Phil Attard, and Ian Larson pp. 2746-2750 Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood, Steven M. Anlage, C. Canedy, R. Ramesh, A. Stanishevsky, and J. Melngailis pp. 2751-2758 Imaging of liquid crystals using a new scanning near-field optical microscope with microfabricated tips and shear force detection Th. Röder, L. Paelke, N. Held, S. Vinzelberg, and H.-S. Kitzerow pp. 2759-2764 Concurrent measurement of adhesive and elastic surface properties with a new modulation technique for scanning force microscopy H.-U. Krotil, Th. Stifter, and O. Marti pp. 2765-2771 Dynamics of damped cantilevers S. Rast, C. Wattinger, U. Gysin, and E. Meyer pp. 2772-2775 Fundamental limits to force detection using quartz tuning forks Robert D. Grober, Jason Acimovic, Jim Schuck, Dan Hessman, Peter J. Kindlemann, Joao Hespanha, A. Stephen Morse, Khaled Karrai, Ingo Tiemann, and Stephan Manus pp. 2776-2780 Scanning nanoscale multiprobes for conductivity measurements P. Břggild, T. M. Hansen, O. Kuhn, F. Grey, T. Junno, and L. Montelius pp. 2781-2783
Ultrahigh pressure cell for materials synthesis Michael A. Hale, Dominic Clausi, C. Grant Willson, Tim Dallas, Javad Hashemi, James Wilson, Daryl James, Mark Holtz, Kurtis Kuhrts, and Bret Combs pp. 2784-2790 An automated apparatus for measuring the tensile strength and compressibility of fine cohesive powders José Manuel Valverde, Antonio Castellanos, Antonio Ramos, Alberto T. Pérez, Michael A. Morgan, and P. Keith Watson pp. 2791-2795 Nanoscratch tester for thin film mechanical properties characterization N. X. Randall and R. Consiglio pp. 2796-2799 Alignment visualization using electroconvection of planar nematics T. M. Bock, J. Bläsing, V. Frette, and I. Rehberg pp. 2800-2806 S-band (2-4 GHz) pulse electron paramagnetic resonance spectrometer: Construction, probe head design, and performance Michael Willer, Jörg Forrer, Jürg Keller, Sabine Van Doorslaer, Arthur Schweiger, Rolf Schuhmann, and Thomas Weiland pp. 2807-2817 Deposition of mass-selected clusters studied by thermal energy atom scattering and low-temperature scanning tunneling microscopy: An experimental setup Harald Jödicke, Renald Schaub, Ashok Bhowmick, René Monot, Jean Buttet, and Wolfgang Harbich pp. 2818-2828 In situ x-ray topography of silicon carbide during crystal growth by sublimation method H. Yamaguchi, S. Nishizawa, T. Kato, N. Oyanagi, W. Bahng, S. Yoshida, K. Arai, Y. Machitani, and T. Kikuchi pp. 2829-2832 Apparatus for deformation tests of solids in liquid 3He T. Hashimoto, S. Katakura, K. Edagawa, S. Takeuchi, and T. Suzuki pp. 2833-2838 Direct temperature monitoring for semiconductors in plasma immersion ion implantation Xiubo Tian and Paul K. Chu pp. 2839-2842 Experimental apparatus for radiometric emissivity measurements of metals T. Furukawa and T. Iuchi pp. 2843-2847 A high-voltage scanning electron microscopy system for in situ electromigration testing J. C. Doan, S. Lee, S.-H. Lee, N. E. Meier, J. C. Bravman, P. A. Flinn, T. N. Marieb, and M. C. Madden pp. 2848-2854 Resonant ultrasound spectroscopy for measurement of mechanical damping: Comparison with broadband viscoelastic spectroscopy T. Lee, R. S. Lakes, and A. Lal pp. 2855-2861
The "Leakage Current Sentinel": A novel plug-in socket device for online biomedical equipment electrical safety surveillance Paolo Cappa, Franco Marinozzi, and Salvatore Andrea Sciuto pp. 2862-2866 New impedance spectrometer for scientific and clinical studies of the respiratory system Pedro Lopes de Melo, Marcelo Martins Werneck, and Antonio Giannella-Neto pp. 2867-2872 High Tc superconducting asymmetric gradiometer for biomagnetic applications K. A. Kouznetsov, J. Borgmann, and John Clarke pp. 2873-2881 Identification and minimization of sources of temporal instabilities in high field (>23 T) resistive magnets Victoria Soghomonian, M. Sabo, A. Powell, P. Murphy, Richard Rosanske, T. A. Cross, and H. J. Schneider-Muntau pp. 2882-2889
Control of the double pendulum optics suspension system of a 30 m triangular Fabry-Pérot cavity M. Barsuglia, F. Bondu, H. Heitmann, Ph. Heusse, C. N. Man, and L. Matone pp. 2890-2894 The Mt. Fuji submillimeter-wave telescope Yutaro Sekimoto, Satoshi Yamamoto, Tomoharu Oka, Masafumi Ikeda, Hiroyuki Maezawa, Tetsuya Ito, Gaku Saito, Mitsuhiro Iwata, Kazuhisa Kamegai, Takeshi Sakai, Ken'ichi Tatematsu, Yuji Arikawa, Yoshiyuki Aso, Takashi Noguchi, Keisuke Miyazawa et al. pp. 2895-2907
Positive-intrinsic-negative diode-based duplexer for microcoil nuclear magnetic resonance D. A. Seeber, J. H. Hoftiezer, and C. H. Pennington pp. 2908-2913 Toroidal cross capacitor for measuring the dielectric constant of gases Thomas J. Buckley, Jean Hamelin, and M. R. Moldover pp. 2914-2921
Simultaneous, noninvasive measurements of convective heat transfer and solid volume fraction at the wall of an entrained gas-solid suspension A. Elizabeth Griffith, Michel Louge, and Jamaludin Mohd-Yusof pp. 2922-2927 On the use of the thermal wave resonator cavity sensor for monitoring hydrocarbon vapors J. A. P. Lima, E. Marín, M. G. da Silva, M. S. Sthel, S. L. Cardoso, D. F. Takeuti, C. Gatts, H. Vargas, C. E. Rezende, and L. C. M. Miranda pp. 2928-2932 Thermal-wave resonator cavity design and measurements of the thermal diffusivity of liquids J. A. Balderas-López, A. Mandelis, and J. A. Garcia pp. 2933-2937 Investigations on exponential lifetime measurements for fluorescence thermometry V. C. Fernicola, L. Rosso, R. Galleano, T. Sun, Z. Y. Zhang, and K. T. V. Grattan pp. 2938-2943