Review of Scientific Instruments, 2000, V 71, N 7.

ARTICLES


OPTICS; ATOMS and MOLECULES; SPECTROSCOPY

 Single crystal optic elements for helium atom microscopy
D. A. MacLaren, W. Allison, and B. Holst
pp. 2625-2634

 Elliptical x-ray microprobe mirrors by differential deposition
Gene E. Ice, Jin-Seok Chung, Jonathan Z. Tischler, Andrew Lunt, and
Lahsen Assoufid
pp. 2635-2639

 A simple microbeam profiling technique for x-ray optics
M. Lankosz and J. Sieber
pp. 2640-2643

 A simple high-resolution on-line x-ray imaging crystal spectrograph 
for laser-plasma interaction studies
V. Arora, S. R. Kumbhare, P. A. Naik, and P. D. Gupta
pp. 2644-2650

 Extreme ultraviolet-vacuum ultraviolet
spectrum detection using image plates
A. Ben-Kish, A. Fisher, E. Cheifetz, and J. L. Schwob
pp. 2651-2654

 Doppler-free modulation transfer spectroscopy of rubidium 
52S1/2-62P1/2 transitions using a frequency-doubled diode laser
 blue-light source Nobuhiko Ito
pp. 2655-2662

 Investigation of the propagation characteristics of 
excimer lasers using a Hartmann-Shack sensor
Bernd Schäfer and Klaus Mann
pp. 2663-2668

 Michelson interferometry with 10 pm accuracy
John Lawall and Ernest Kessler
pp. 2669-2676

 New design of the variable angle infrared
spectroscopic ellipsometer using double Fourier transforms
Guo-Qiang Xia, Rong-Jun Zhang, Yu-Li Chen, Hai-Bing Zhao, Song-You
Wang, Shi-Ming Zhou, Yu-Xiang Zheng, Yue-Mei Yang, Liang-Yao Chen,
Jun-Hao Chu, and Zhi-Ming Wang
pp. 2677-2683

 Ultrasmall volume refractive index
detection using microinterferometry
Kelly Swinney, Dmitry Markov, and Darryl J. Bornhop
pp. 2684-2692

PARTICLE SOURCES, OPTICS and ACCELERATION

 Crystal adjustment by means of blocking pattern
H. Ellmer, R. Aichinger, E. Winkler, D. Semrad, V. Mergel
and O.Jagutzki
pp. 2693-2697


 High-energy neutral particle measurement system in the large 
helical device
Tetsuo Ozaki, Vincenzo Zanza, Giovanni Bracco, Arturo Moleti,
Benedetto Tilia, Alessandro Sibio, Shigeru Sudo, Hideya Nakanishi,
Mamoru Kojima, and Mamoru Shoji , (G1/G2 Experimental Group )
pp. 2698-2703

 Detection efficiency of a channel electron
multiplier for low energy incident noble gas ions
M. Tassotto and P. R. Watson
pp. 2704-2709

 A sensitive dispersion interferometer with high temporal resolution 
for electron density measurements
Valentin Licht and Hansjoachim Bluhm
pp. 2710-2715

NUCLEAR PHYSICS, FUSION and PLASMAS

 Efficient multichannel Thomson scattering measurement system for 
diagnostics of low-temperature plasmas
A. Kono and K. Nakatani
pp. 2716-2721

 Measurements of characteristic transients
of planar electrostatic probes in cold plasmas
J. P. Booth, N. St. J. Braithwaite, A. Goodyear, and P. Barroy
pp. 2722-2727

 Simple microwave preionization source for ohmic plasmas
W. Choe, Gi-Chung Kwon, Junghee Kim, Jayhyun Kim, Sang-Jean Jeon, and
Songwhe Huh
pp. 2728-2732

 Ion dynamics in the sheath in multicomponent plasma with negative ions
Ram Prakash, A. Sarma, and Joyanti Chutia
pp. 2733-2736

BASIC PHENOMENA

 Monolithic sapphire parametric transducer
operation at cryogenic temperatures
C. R. Locke, M. E. Tobar, and E. N. Ivanov
pp. 2737-2741

MICROSCOPY and IMAGING

 Subresolution axial distance measurements in far-field 
fluorescence microscopy with precision of 1 nanometer
Michael Schmidt, Matthias Nagorni, and Stefan W. Hell
pp. 2742-2745

 Calibration of the torsional spring constant and the lateral 
photodiode response of frictional force microscopes
Adam Feiler, Phil Attard, and Ian Larson
pp. 2746-2750

 Quantitative imaging of dielectric permittivity and tunability 
with a near-field scanning microwave microscope
D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood, Steven M. Anlage,
C. Canedy, R. Ramesh, A. Stanishevsky, and J. Melngailis
pp. 2751-2758

 Imaging of liquid crystals using a new scanning near-field 
optical microscope with microfabricated tips and shear force detection
Th. Röder, L. Paelke, N. Held, S. Vinzelberg, and H.-S. Kitzerow
pp. 2759-2764

 Concurrent measurement of adhesive and
elastic surface properties with a new modulation technique for
scanning force microscopy
H.-U. Krotil, Th. Stifter, and O. Marti
pp. 2765-2771

 Dynamics of damped cantilevers
S. Rast, C. Wattinger, U. Gysin, and E. Meyer
pp. 2772-2775

 Fundamental limits to force detection using quartz tuning forks
Robert D. Grober, Jason Acimovic, Jim Schuck, Dan Hessman, Peter J.
Kindlemann, Joao Hespanha, A. Stephen Morse, Khaled Karrai, Ingo
Tiemann, and Stephan Manus
pp. 2776-2780

 Scanning nanoscale multiprobes for
conductivity measurements
P. Břggild, T. M. Hansen, O. Kuhn, F. Grey, T. Junno, 
and L. Montelius
pp. 2781-2783

CONDENSED MATTER; MATERIALS

 Ultrahigh pressure cell for materials synthesis
Michael A. Hale, Dominic Clausi, C. Grant Willson, Tim Dallas, Javad
Hashemi, James Wilson, Daryl James, Mark Holtz, Kurtis Kuhrts, and
Bret Combs
pp. 2784-2790

 An automated apparatus for measuring the tensile strength and 
compressibility of fine cohesive powders
José Manuel Valverde, Antonio Castellanos, Antonio Ramos, Alberto T.
Pérez, Michael A. Morgan, and P. Keith Watson
pp. 2791-2795

 Nanoscratch tester for thin film mechanical properties characterization
N. X. Randall and R. Consiglio
pp. 2796-2799

 Alignment visualization using electroconvection of planar nematics
T. M. Bock, J. Bläsing, V. Frette, and I. Rehberg
pp. 2800-2806

 S-band (2-4 GHz) pulse electron paramagnetic resonance spectrometer:
Construction, probe head design, and performance
Michael Willer, Jörg Forrer, Jürg Keller, Sabine Van Doorslaer, Arthur
Schweiger, Rolf Schuhmann, and Thomas Weiland
pp. 2807-2817

 Deposition of mass-selected clusters studied by thermal energy atom 
scattering and low-temperature scanning
tunneling microscopy: An experimental setup
Harald Jödicke, Renald Schaub, Ashok Bhowmick, René Monot, Jean
Buttet, and Wolfgang Harbich
pp. 2818-2828

 In situ x-ray topography of silicon carbide during crystal growth 
by sublimation method
H. Yamaguchi, S. Nishizawa, T. Kato, N. Oyanagi, W. Bahng, S. Yoshida,
K. Arai, Y. Machitani, and T. Kikuchi
pp. 2829-2832

 Apparatus for deformation tests of solids in liquid 3He
T. Hashimoto, S. Katakura, K. Edagawa, S. Takeuchi, and T. Suzuki
pp. 2833-2838

 Direct temperature monitoring for semiconductors in plasma immersion
 ion implantation
Xiubo Tian and Paul K. Chu
pp. 2839-2842

 Experimental apparatus for radiometric emissivity measurements of metals
T. Furukawa and T. Iuchi
pp. 2843-2847

 A high-voltage scanning electron microscopy system for in situ 
electromigration testing
J. C. Doan, S. Lee, S.-H. Lee, N. E. Meier, J. C. Bravman, P. A.
Flinn, T. N. Marieb, and M. C. Madden
pp. 2848-2854

 Resonant ultrasound spectroscopy for measurement of mechanical damping:
Comparison with broadband viscoelastic spectroscopy
T. Lee, R. S. Lakes, and A. Lal
pp. 2855-2861

BIOLOGY and MEDICINE

 The "Leakage Current Sentinel": A novel plug-in socket device for online
biomedical equipment electrical safety surveillance
Paolo Cappa, Franco Marinozzi, and Salvatore Andrea Sciuto
pp. 2862-2866

 New impedance spectrometer for scientific and clinical studies of the
respiratory system
Pedro Lopes de Melo, Marcelo Martins Werneck, and Antonio
Giannella-Neto
pp. 2867-2872

 High Tc superconducting asymmetric
gradiometer for biomagnetic applications
K. A. Kouznetsov, J. Borgmann, and John Clarke
pp. 2873-2881

 Identification and minimization of sources
of temporal instabilities in high field (>23 T) resistive magnets
Victoria Soghomonian, M. Sabo, A. Powell, P. Murphy, Richard Rosanske,
T. A. Cross, and H. J. Schneider-Muntau
pp. 2882-2889

GRAVITY; GEOPHYSICS; ASTRONOMY and ASTROPHYSICS

 Control of the double pendulum optics
suspension system of a 30 m triangular Fabry-Pérot cavity
M. Barsuglia, F. Bondu, H. Heitmann, Ph. Heusse, C. N. Man, and L.
Matone
pp. 2890-2894

 The Mt. Fuji submillimeter-wave telescope
Yutaro Sekimoto, Satoshi Yamamoto, Tomoharu Oka, Masafumi Ikeda,
Hiroyuki Maezawa, Tetsuya Ito, Gaku Saito, Mitsuhiro Iwata, Kazuhisa
Kamegai, Takeshi Sakai, Ken'ichi Tatematsu, Yuji Arikawa, Yoshiyuki
Aso, Takashi Noguchi, Keisuke Miyazawa et al.
pp. 2895-2907

ELECTRONICS; ELECTROMAGNETIC TECHNOLOGY; MICROWAVES

 Positive-intrinsic-negative diode-based
duplexer for microcoil nuclear magnetic resonance
D. A. Seeber, J. H. Hoftiezer, and C. H. Pennington
pp. 2908-2913

 Toroidal cross capacitor for measuring the
dielectric constant of gases
Thomas J. Buckley, Jean Hamelin, and M. R. Moldover
pp. 2914-2921

GENERAL INSTRUMENTS

 Simultaneous, noninvasive measurements of convective heat transfer
 and solid volume fraction at the wall of an entrained gas-solid suspension
A. Elizabeth Griffith, Michel Louge, and Jamaludin Mohd-Yusof
pp. 2922-2927

 On the use of the thermal wave resonator
cavity sensor for monitoring hydrocarbon vapors
J. A. P. Lima, E. Marín, M. G. da Silva, M. S. Sthel, S. L. Cardoso,
D. F. Takeuti, C. Gatts, H. Vargas, C. E. Rezende, and L. C. M.
Miranda
pp. 2928-2932

 Thermal-wave resonator cavity design and
measurements of the thermal diffusivity of liquids
J. A. Balderas-López, A. Mandelis, and J. A. Garcia
pp. 2933-2937

 Investigations on exponential lifetime
measurements for fluorescence thermometry
V. C. Fernicola, L. Rosso, R. Galleano, T. Sun, Z. Y. Zhang, 
and K. T. V. Grattan
pp. 2938-2943