Introduction to time and frequency metrology Judah Levine pp. 2567-2596


Transmission grating spectroscopy in the 10 keV range E. Fill, K.-H. Stephan, P. Predehl, G. Pretzler, K. Eidmann, and A. Saemann pp. 2597-2600 Construction of the multilayered-mirror monochromator beam line for the study of synchrotron radiation stimulated process Harutaka Mekaru, Yoshiyuki Tsusaka, Takayuki Miyamae, Toyohiko Kinoshita, Tsuneo Urisu, Shin Masui, Eijiro Toyota, and Hisataka Takenaka pp. 2601-2605 Rotatable source crossed molecular beams apparatus with pulsed ultraviolet/vacuum ultraviolet photoionization detection P. A. Willis, H. U. Stauffer, R. Z. Hinrichs, and H. F. Davis pp. 2606-2614 High resolution pulsed field ionization photoelectron spectroscopy using multibunch synchrotron radiation: Time-of-flight selection scheme G. K. Jarvis, Y. Song, and C. Y. Ng pp. 2615-2621 Setting up and time-resolution measurement of a radio-frequency-based streak camera A. V. Aleksandrov, N. S. Dikansky, V. Guidi, G. V. Lamanna, P. V. Logatchov, S. V. Shiyankov, and L. Tecchio pp. 2622-2626 Three-dimensional optical trapping and evanescent wave light scattering for direct measurement of long range forces between a colloidal particle and a surface A. R. Clapp, A. G. Ruta, and R. B. Dickinson pp. 2627-2636
Experimental studies on a compact electron cyclotron resonance plasma x-ray source R. Baskaran and T. S. Selvakumaran pp. 2637-2645 First investigations of a warm electron beam ion trap for the production of highly charged ions V. P. Ovsyannikov and G. Zschornack pp. 2646-2651 Improvement of beam emittance of the CEA high intensity proton source SILHI R. Gobin, P.-Y. Beauvais, R. Ferdinand, P.-A. Leroy, L. Celona, G. Ciavola, and S. Gammino pp. 2652-2654 New method of designing pole profile in combined function magnets of high field quality P. R. Sarma, S. K. Pattanayak, and R. K. Bhandari pp. 2655-2660
Characteristics of 63.6° cylindrical energy analyzer used as charge exchange neutral particle analyzer T. Goto, K. Ishii, A. Nagao, Y. Goi, Y. Katsuki, N. Kikuno, N. Ishibashi, Y. Ono, M. Yamanashi, Y. Nakashima, T. Tamano, and K. Yatsu pp. 2661-2664 Liquid stub tuner for ion cyclotron heating R. Kumazawa, T. Mutoh, T. Seki, F. Sinpo, G. Nomura, T. Ido, T. Watari, Jean-Marie Noterdaeme, and Yangping Zhao pp. 2665-2673 Spatially resolved spectra of resonantly pumped laser produced plasmas of lithium Tom McCormack and Gerry O'Sullivan pp. 2674-2680 A 400 kHz, fast-sweep Langmuir probe for measuring plasma fluctuations G. Chiodini, C. Riccardi, and M. Fontanesi pp. 2681-2688 Compact floating ion energy analyzer for measuring energy distributions of ions bombarding radio-frequency biased electrode surfaces Erik A. Edelberg, Andrew Perry, Neil Benjamin, and Eray S. Aydil pp. 2689-2698
Constant current: A method for obtaining hysteresis loops in ferroelectric materials José A. Giacometti, Célio Wisniewski, Walterley A. Moura, and Paulo António Ribeiro pp. 2699-2702 High accuracy magnetic field measurements with a Hall probe C. Schott, R. S. Popovic, S. Alberti, and M. Q. Tran pp. 2703-2707 Simulation and calibration of an open inductive sensor for pulsed field magnetization measurements L. Weckhuysen, J. Vanacken, L. Trappeniers, M. J. Van Bael, W. Boon, K. Rosseel, F. Herlach, V. V. Moshchalkov, and Y. Bruynseraede pp. 2708-2710 Superconducting quantum interference device based resistance bridge for shot noise measurement on low impedance samples X. Jehl, P. Payet-Burin, C. Baraduc, R. Calemczuk, and M. Sanquer pp. 2711-2714 InAs/Al0.2Ga0.8Sb quantum well Hall sensors with improved temperature stability J. Bekaert, V. V. Moshchalkov, Y. Bruynseraede, M. Behet, J. De Boeck, and G. Borghs pp. 2715-2718 Measuring temperatures in the presence of external radiation by flash assisted multiwavelength pyrometry H. R. Tschudi and M. Schubnell pp. 2719-2727 Specific heat (Cp) of Apiezon N grease (1 to 108 K) and calorimetry: Cp of copper below 30 K C. A. Swenson pp. 2728-2731 A simple, high sensitivity torquemeter P. J. Flanders and G. Wu pp. 2732-2734 Active low frequency vertical vibration isolation Joel M. Hensley, Achim Peters, and Steven Chu pp. 2735-2741 Taber vibration isolator for vacuum and cryogenic applications H. W. Chan, J. C. Long, and J. C. Price pp. 2742-2750
Novel scanning near-field optical microscope (SNOM)/scanning confocal optical microscope based on normal force distance regulation and bent etched fiber tips J. F. Wolf, P. E. Hillner, R. Bilewicz, P. Kölsch, and J. P. Rabe pp. 2751-2757 Femtosecond pump-probe near-field optical microscopy B. A. Nechay, U. Siegner, M. Achermann, H. Bielefeldt, and U. Keller pp. 2758-2764 A low-temperature dynamic mode scanning force microscope operating in high magnetic fields J. Rychen, T. Ihn, P. Studerus, A. Herrmann, and K. Ensslin pp. 2765-2768 Manipulation force microscopy G. Sagvolden, I. Giaever, and J. Feder pp. 2769-2775 A high resolution long travel friction-drive micropositioner with programmable step size S. H. Chang and S. S. Li pp. 2776-2782 Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves M. Tabib-Azar, P. S. Pathak, G. Ponchak, and S. LeClair pp. 2783-2792 Enhancing electron beam induced current images Vincent K. S. Ong and Dethau Wu pp. 2793-2795
Noncontact technique for measuring surface tension and viscosity of molten materials using high temperature electrostatic levitation Won-Kyu Rhim, Kenichi Ohsaka, Paul-François Paradis, and R. Erik Spjut pp. 2796-2801 Direct-current method for differentiating contact and bulk low frequency resistance fluctuations P. W. West pp. 2802-2807 Electronic signal regulator for constant resolution inelastic electron tunneling spectroscopy T. R. Seman and R. R. Mallik pp. 2808-2814 Switching device for the superconducting phase transition measurements of thin W films using a single superconducting quantum interference device G. Sáfrán, M. Loidl, O. Meier, G. Angloher, F. Pröbst, and W. Seidel pp. 2815-2817 In situ sample temperature measurement in plasma immersion ion implantation Xiubo Tian, Zhineng Fan, Xuchu Zeng, Zhaoming Zeng, Baoyin Tang, and Paul K. Chu pp. 2818-2821 Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes Kathryn Wilder, Hyongsok T. Soh, Abdullah Atalar, and Calvin F. Quate pp. 2822-2827
Coupling of gas chromatography and molecular beam/mass spectrometry analytical techniques: Application to flame structure study A. Turbiez, P. Devynck, P. Desgroux, and J. F. Pauwels pp. 2828-2835 Fabrication and evaluation of a dimension-reduction fiberoptic system for chemical imaging applications Matthew P. Nelson and M. L. Myrick pp. 2836-2844
Miniaturized scintillation technique for protein solubility determinations Angela R. Feeling-Taylor, R. Michael Banish, Rhoda Elison Hirsch, and Peter G. Vekilov pp. 2845-2849 Teeth mobility measurement by laser Doppler vibrometer P. Castellini and L. Scalise pp. 2850-2855
An active telescope secondary mirror control system Favio Bortoletto, Carlotta Bonoli, Daniela Fantinel, Daniele Gardiol, and Claudio Pernechele pp. 2856-2860
Application of band-stop filters for the 30–200 GHz range in oversized microwave systems H. J. van der Meiden pp. 2861-2863 Electrically controlled broadband microwave attenuator with p-i-n diode switches Hiroshi Nakano and Yoshihiko Kato pp. 2864-2865 Design and evaluation of a low thermal electromotive force guarded scanner for resistance measurements Dean G. Jarrett, James A. Marshall, Thomas A. Marshall, and Ronald F. Dziuba pp. 2866-2871 Improved calibrator for the evaluation of batch produced strain gauges in cryogenic environments W. H. Huber, L. M. Hernandez, and A. M. Goldman pp. 2872-2874
Design and operation of different optical fiber sensors for displacement measurements Hossein Golnabi pp. 2875-2879

A simple technique using the diffraction pattern of a shadow region for the evaluation of a vertex of a wedge having an acute angle N. Kanai pp. 2880-2881 Simple method to reduce the dead time of multichannel analyzers J. M. Puzovi and I. V. Aniin pp. 2882-2883