Review of Scientific Instruments, 2000, V 71, N 5, May.


Femtosecond pulse shaping using spatial light modulators A. M. Weiner pp. 1929-1960

Instrumental noise and detectivity analysis of photopyroelectric destructive thermal-wave interferometry Chinhua Wang and Andreas Mandelis pp. 1961-1970 Measurements of the velocity and temperature in a turbulent flow by the laser photothermal effect with the new compulsorily phase locked interferometer Noboru Nakatani pp. 1971-1974 A highly sensitive photoacoustic spectrometer for near infrared overtone Lu-yuan Hao, Jia-xiang Han, Qiang Shi, Jin-hui Zhang, Jin-jin Zheng, and Qing-shi Zhu pp. 1975-1980 Multiple-reflection interferometer for high accuracy measurement of small vibration displacement Doo Hee Lee and Byoung Yoon Kim pp. 1981-1986 Optimization of operating conditions for a fast-axial-flow, radio frequency discharge-excited, room-temperature CO laser Kouki Shimizu, Manabu Taniwaki, Shunichi Sato, Hiroshi Nagano, and Kazuo Maeno pp. 1987-1990 Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics I. C. Noyan, P.-C. Wang, S. K. Kaldor, J. L. Jordan-Sweet, and E. G. Liniger pp. 1991-2000 Small-displacement monochromator for microdiffraction experiments Gene E. Ice, Jin-Seok Chung, Walter Lowe, Ernest Williams, and Joel Edelman pp. 2001-2006 Thomson scattering using an atomic notch filter L. P. Bakker, J. M. Freriks, F. J. de Hoog, and G. M. W. Kroesen pp. 2007-2014
Design and performance of a highly efficient mass spectrometer for molecular beams M. DeKieviet, D. Dubbers, M. Klein, U. Pieles, and C. Schmidt pp. 2015-2018 Very low temperature drift tube mass spectrometer H. Tanuma, M. Sakamoto, H. Fujimatsu, and N. Kobayashi pp. 2019-2024 A method for "on-line" determination of beam-jet overlaps; application to cluster fragmentation studies K. Wohrer, M. Chabot, R. Fossé, and D. Gardès pp. 2025-2032 A new method to study metastable fragmentation of clusters using a reflectron time-of-flight mass spectrometer J.-M. L'Hermite, L. Marcou, F. Rabilloud, and P. Labastie pp. 2033-2037 Highly charged metal ions produced from volatile organometallic compounds in a room temperature electron beam ion trap T. Werner, G. Zschornack, F. Großmann, V. P. Ovsyannikov, and F. Ullmann pp. 2038-2040 Status report of the accelerator for multiply charged ions in Grenoble X. Biquard, A. Brenac, F. Gustavo, and D. Hitz pp. 2041-2044 High precision polarimeter system for atomic polarization and tilted-foil experiments with 1.7 keV/amu 14N + beam S. Shimizu, E. Doumoto, S. Tanimoto, M. Nakamura, Y. Hirayama, K. Horie, T. Shigematsu, H. Izumi, T. Shimoda, and N. Takahashi pp. 2045-2049 Absolute detection efficiency of a microchannel plate detector for neutral atoms M. Barat, J. C. Brenot, J. A. Fayeton, and Y. J. Picard pp. 2050-2052
Low cost high resolution thermoluminescence spectrometer M. W. Rhodes, S. Wanwilairat, T. Vilaithong, and W. Hoffmann pp. 2053-2057 A fast-scanning heterodyne radiometer for electron cyclotron emission measurements in HT-7 superconducting tokamak S. Y. Zhang, V. I. Poznyak, G. Ploskirev, D. Kalupin, Y. X. Wan, J. K. Xie, and J. R. Luo , (HT-7 Team ) pp. 2058-2061 A physical model of the beam impedance method within ideal nested magnetic surfaces Takateru Hamada, Tokuhiro Obiki, Tohru Mizuuchi, Fumimichi Sano, and Masahiko Nakasuga pp. 2062-2067 Space-time resolving vacuum ultraviolet spectrometer based on a rotating polyhedral mirror Xiaodong Lin and Jikang Xie pp. 2068-2070 Fast reciprocating probe assembly for the Hanbit magnetic mirror device J. G. Bak, S. G. Lee, S. M. Hwang, Y. S. Choi, and K. S. Chung pp. 2071-2076
Highly charged ion based time-of-flight emission microscope Alex V. Hamza, Alan V. Barnes, Ed Magee, Mike Newman, Thomas Schenkel, Joseph W. McDonald, and Dieter H. Schneider pp. 2077-2081 Fuzzy logic algorithm to extract specific interaction forces from atomic force microscopy data Sandor Kasas, Beat M. Riederer, Stefan Catsicas, Brunero Cappella, and Giovanni Dietler pp. 2082-2086 A metallic microcantilever electric contact probe array incorporated in an atomic force microscope T. Ondarçuhu, L. Nicu, S. Cholet, C. Bergaud, S. Gerdes, and C.Joachim In situ observation of surface deformation of polymer films by atomic force microscopy Takashi Nishino, Akiko Nozawa, Masaru Kotera, and Katsuhiko Nakamae pp. 2094-2096 High-speed atomic force microscopy in liquid T. Sulchek, R. Hsieh, J. D. Adams, S. C. Minne, C. F. Quate, and D. M. Adderton pp. 2097-2099 Construction and characterization of a heating stage for a scanning probe microscope up to 215 °C Z. Xie, E. Z. Luo, J. B. Xu, I. H. Wilson, L. H. Zhao, and X. X. Zhang pp. 2100-2103
Light output measurements of the organic light-emitting devices Yi He, Reiji Hattori, and Jerzy Kanicki pp. 2104-2107 Analysis of light scattering centers in crystals using modified light scattering tomography K. Sakai pp. 2108-2110 Studies on molten glass sealing in diffusion coefficient measurements using shear cell technique Jianding Yu, Makoto Natsuisaka, Hirokazu Kato, Satoshi Matsumoto, Kyoichi Kinoshita, Toshio Itami, and Shinichi Yoda pp. 2111-2116 Characterization of phosphosilicate thin films using confocal Raman microscopy Manyalibo J. Matthews, Alexander L. Harris, Allan J. Bruce, and Mark J. Cardillo pp. 2117-2120 Temperature stabilized effusion cell evaporation source for thin film deposition and molecular-beam epitaxy H. F. Tiedje and D. E. Brodie pp. 2121-2124 Production of metal oxide thin films by pulsed arc molecular beam deposition Eric F. Rexer, Donald B. Wilbur, Jeffrey L. Mills, Robert L. DeLeon, and James F. Garvey pp. 2125-2130 A novel thermal desorption spectroscopy apparatus Facundo J. Castro and Gabriel Meyer pp. 2131-2133 Infrared optical switch by the use of optically excited free carriers in semiconductors Mitsunori Saito and Takeshi Inoue pp. 2134-2135 Measurement of the absolute penetration depth and surface resistance of superconductors and normal metals with the variable spacing parallel plate resonator Vladimir V. Talanov, Lucia V. Mercaldo, Steven M. Anlage, and John H. Claassen pp. 2136-2146 Very high resolution measurement of the penetration depth of superconductors by a novel single-coil inductance technique A. Gauzzi, J. Le Cochec, G. Lamura, B. J. Jönsson, V. A. Gasparov, F. R. Ladan, B. Plaçais, P. A. Probst, D. Pavuna, and J. Bok pp. 2147-2153 Thermal characterization of film-on-substrate systems with modulated thermoreflectance microscopy Bincheng Li, L. Pottier, J. P. Roger, D. Fournier, and E. Welsch pp. 2154-2160 Spectral analysis: A new method to measure the spontaneous polarization of ferroelectric liquid crystals O. Gimenes Martins and A. M. Figueiredo Neto pp. 2161-2165
Diameter control of an extremely thin cylindrical microprobe by electrochemical etching Y. M. Lim and S. H. Kim pp. 2166-2168 Pulsed technique for observing infrared emissions from ionic gas phase reactions at low reactant ion concentrations T. L. Williams, B. K. Decker, L. M. Babcock, N. G. Adams, and P. W. Harland pp. 2169-2179
Fast mixing device inside a nuclear magnetic resonance magnet: A tool for observing early steps in protein folding M. Hamang, A. Sanson, L. Liagre, V. Forge, and P. Berthault pp. 2180-2183 Cancellation technique of external noise inside a magnetically shielded room used for biomagnetic measurements Akihiko Kandori, Tsuyoshi Miyashita, and Keiji Tsukada pp. 2184-2190 Phase-amplitude crosstalk in intensity modulated near infrared spectroscopy K. Alford and Y. Wickramasinghe pp. 2191-2195 Design of a scanning laser optical trap for multiparticle manipulation C. Mio, T. Gong, A. Terray, and D. W. M. Marr pp. 2196-2200 Fluorescence measurements on nanotiter plates M. Hessling, J. Ihlemann, and G. Marowsky pp. 2201-2205
Full scale prototype of high Q pendulum for interferometric gravitational wave detectors G. Cagnoli, L. Gammaitoni, J. Kovalik, F. Marchesoni, and M. Punturo pp. 2206-2210
A two-axis micromachined silicon actuator with micrometer range electrostatic actuation and picometer sensitive capacitive detection F. Ayela, J. L. Bret, J. Chaussy, T. Fournier, and E. Ménégaz pp. 2211-2218 Capacitance based scanner for thickness mapping of thin dielectric films John Graham, Marek Kryzeminski, and Zoran Popovic pp. 2219-2223 Characteristics of fritting contacts utilized for micromachined wafer probe cards Toshihiro Itoh, Tadatomo Suga, Gunter Engelmann, Jürgen Wolf, Oswin Ehrmann, and Herbert Reichl pp. 2224-2227 Further considerations on the preparation of small electrical contacts by spot welding I. R. Walker and C. J. Moss pp. 2228-2232 Rare earth optical temperature sensor Donald L. Chubb and David S. Wolford pp. 2233-2240 Melt velocity measurement by a noncontacting electromagnetic probe J. W. Suh and Z. H. Lee pp. 2241-2245

Raman shifting a tunable ArF laser to wavelengths of 190-240 nm R. Jeffrey Balla and G. C. Herring pp. 2246-2247 Automated system for measuring optical parameters for coherence-modulated optical links C. Gutiérrez-Martínez and J. Rodríguez-Asomoza pp. 2248-2249