Review of Scientific Instruments, 2000, V 71, N 5, May.
REVIEW ARTICLE
Femtosecond pulse shaping using spatial light modulators
A. M. Weiner
pp. 1929-1960
ARTICLES
OPTICS; ATOMS and MOLECULES; SPECTROSCOPY
Instrumental noise and detectivity
analysis of photopyroelectric destructive thermal-wave
interferometry
Chinhua Wang and Andreas Mandelis
pp. 1961-1970
Measurements of the velocity and
temperature in a turbulent flow by the laser photothermal effect with
the new compulsorily phase locked interferometer
Noboru Nakatani
pp. 1971-1974
A highly sensitive photoacoustic spectrometer for near
infrared overtone
Lu-yuan Hao, Jia-xiang Han, Qiang Shi, Jin-hui Zhang,
Jin-jin Zheng, and Qing-shi Zhu
pp. 1975-1980
Multiple-reflection interferometer for high
accuracy measurement of small vibration displacement
Doo Hee Lee and Byoung Yoon Kim
pp. 1981-1986
Optimization of operating conditions for a fast-axial-flow,
radio frequency discharge-excited, room-temperature CO laser
Kouki Shimizu, Manabu Taniwaki, Shunichi Sato, Hiroshi Nagano, and
Kazuo Maeno
pp. 1987-1990
Divergence effects in monochromatic x-ray
microdiffraction using tapered capillary optics
I. C. Noyan, P.-C. Wang, S. K. Kaldor, J. L. Jordan-Sweet,
and E. G. Liniger
pp. 1991-2000
Small-displacement monochromator for
microdiffraction experiments
Gene E. Ice, Jin-Seok Chung, Walter Lowe, Ernest Williams,
and Joel Edelman
pp. 2001-2006
Thomson scattering using an atomic notch filter
L. P. Bakker, J. M. Freriks, F. J. de Hoog, and G. M. W. Kroesen
pp. 2007-2014
PARTICLE SOURCES, OPTICS and ACCELERATION
Design and performance of a highly
efficient mass spectrometer for molecular beams
M. DeKieviet, D. Dubbers, M. Klein, U. Pieles, and C. Schmidt
pp. 2015-2018
Very low temperature drift tube mass spectrometer
H. Tanuma, M. Sakamoto, H. Fujimatsu, and N. Kobayashi
pp. 2019-2024
A method for "on-line" determination of beam-jet overlaps;
application to cluster fragmentation studies
K. Wohrer, M. Chabot, R. Fossé, and D. Gardès
pp. 2025-2032
A new method to study metastable fragmentation of
clusters using a reflectron time-of-flight mass
spectrometer
J.-M. L'Hermite, L. Marcou, F. Rabilloud, and P. Labastie
pp. 2033-2037
Highly charged metal ions produced from volatile organometallic
compounds in a room temperature electron beam ion trap
T. Werner, G. Zschornack, F. Großmann, V. P. Ovsyannikov, and F.
Ullmann
pp. 2038-2040
Status report of the accelerator for
multiply charged ions in Grenoble
X. Biquard, A. Brenac, F. Gustavo, and D. Hitz
pp. 2041-2044
High precision polarimeter system for atomic
polarization and tilted-foil experiments with 1.7 keV/amu 14N +
beam
S. Shimizu, E. Doumoto, S. Tanimoto, M. Nakamura, Y. Hirayama, K.
Horie, T. Shigematsu, H. Izumi, T. Shimoda, and N. Takahashi
pp. 2045-2049
Absolute detection efficiency of a
microchannel plate detector for neutral atoms
M. Barat, J. C. Brenot, J. A. Fayeton, and Y. J. Picard
pp. 2050-2052
NUCLEAR PHYSICS, FUSION and PLASMAS
Low cost high resolution thermoluminescence spectrometer
M. W. Rhodes, S. Wanwilairat, T. Vilaithong, and W. Hoffmann
pp. 2053-2057
A fast-scanning heterodyne radiometer for electron cyclotron
emission measurements in HT-7 superconducting tokamak
S. Y. Zhang, V. I. Poznyak, G. Ploskirev, D. Kalupin, Y. X. Wan,
J. K. Xie, and J. R. Luo , (HT-7 Team )
pp. 2058-2061
A physical model of the beam impedance method within ideal
nested magnetic surfaces
Takateru Hamada, Tokuhiro Obiki, Tohru Mizuuchi, Fumimichi Sano, and
Masahiko Nakasuga
pp. 2062-2067
Space-time resolving vacuum ultraviolet
spectrometer based on a rotating polyhedral mirror
Xiaodong Lin and Jikang Xie
pp. 2068-2070
Fast reciprocating probe assembly for the
Hanbit magnetic mirror device
J. G. Bak, S. G. Lee, S. M. Hwang, Y. S. Choi, and K. S. Chung
pp. 2071-2076
MICROSCOPY and IMAGING
Highly charged ion based time-of-flight emission microscope
Alex V. Hamza, Alan V. Barnes, Ed Magee, Mike Newman, Thomas Schenkel,
Joseph W. McDonald, and Dieter H. Schneider
pp. 2077-2081
Fuzzy logic algorithm to extract specific
interaction forces from atomic force microscopy data
Sandor Kasas, Beat M. Riederer, Stefan Catsicas, Brunero Cappella, and
Giovanni Dietler
pp. 2082-2086
A metallic microcantilever electric
contact probe array incorporated in an atomic force microscope
T. Ondarçuhu, L. Nicu, S. Cholet, C. Bergaud, S. Gerdes, and
C.Joachim
In situ observation of surface deformation
of polymer films by atomic force microscopy
Takashi Nishino, Akiko Nozawa, Masaru Kotera, and Katsuhiko Nakamae
pp. 2094-2096
High-speed atomic force microscopy in liquid
T. Sulchek, R. Hsieh, J. D. Adams, S. C. Minne, C. F. Quate, and D. M.
Adderton
pp. 2097-2099
Construction and characterization of a
heating stage for a scanning probe microscope up to 215 °C
Z. Xie, E. Z. Luo, J. B. Xu, I. H. Wilson, L. H. Zhao, and X. X. Zhang
pp. 2100-2103
CONDENSED MATTER; MATERIALS
Light output measurements of the organic
light-emitting devices
Yi He, Reiji Hattori, and Jerzy Kanicki
pp. 2104-2107
Analysis of light scattering centers in
crystals using modified light scattering tomography
K. Sakai
pp. 2108-2110
Studies on molten glass sealing in
diffusion coefficient measurements using shear cell technique
Jianding Yu, Makoto Natsuisaka, Hirokazu Kato, Satoshi Matsumoto,
Kyoichi Kinoshita, Toshio Itami, and Shinichi Yoda
pp. 2111-2116
Characterization of phosphosilicate thin
films using confocal Raman microscopy
Manyalibo J. Matthews, Alexander L. Harris, Allan J. Bruce, and Mark
J. Cardillo
pp. 2117-2120
Temperature stabilized effusion cell
evaporation source for thin film deposition and molecular-beam epitaxy
H. F. Tiedje and D. E. Brodie
pp. 2121-2124
Production of metal oxide thin films by
pulsed arc molecular beam deposition
Eric F. Rexer, Donald B. Wilbur, Jeffrey L. Mills, Robert L. DeLeon,
and James F. Garvey
pp. 2125-2130
A novel thermal desorption spectroscopy
apparatus
Facundo J. Castro and Gabriel Meyer
pp. 2131-2133
Infrared optical switch by the use of
optically excited free carriers in semiconductors
Mitsunori Saito and Takeshi Inoue
pp. 2134-2135
Measurement of the absolute penetration
depth and surface resistance of superconductors and normal metals with
the variable spacing parallel plate resonator
Vladimir V. Talanov, Lucia V. Mercaldo, Steven M. Anlage, and John H.
Claassen
pp. 2136-2146
Very high resolution measurement of the penetration depth
of superconductors by a novel single-coil inductance technique
A. Gauzzi, J. Le Cochec, G. Lamura, B. J. Jönsson, V. A. Gasparov, F.
R. Ladan, B. Plaçais, P. A. Probst, D. Pavuna, and J. Bok
pp. 2147-2153
Thermal characterization of
film-on-substrate systems with modulated thermoreflectance microscopy
Bincheng Li, L. Pottier, J. P. Roger, D. Fournier, and E. Welsch
pp. 2154-2160
Spectral analysis: A new method to measure
the spontaneous polarization of ferroelectric liquid crystals
O. Gimenes Martins and A. M. Figueiredo Neto
pp. 2161-2165
CHEMISTRY
Diameter control of an extremely thin
cylindrical microprobe by electrochemical etching
Y. M. Lim and S. H. Kim
pp. 2166-2168
Pulsed technique for observing infrared
emissions from ionic gas phase reactions at low reactant ion
concentrations
T. L. Williams, B. K. Decker, L. M. Babcock,
N. G. Adams, and P. W. Harland
pp. 2169-2179
BIOLOGY and MEDICINE
Fast mixing device inside a nuclear magnetic resonance
magnet: A tool for observing early steps in protein folding
M. Hamang, A. Sanson, L. Liagre, V. Forge, and P. Berthault
pp. 2180-2183
Cancellation technique of external noise
inside a magnetically shielded room used for biomagnetic measurements
Akihiko Kandori, Tsuyoshi Miyashita, and Keiji Tsukada
pp. 2184-2190
Phase-amplitude crosstalk in intensity
modulated near infrared spectroscopy
K. Alford and Y. Wickramasinghe
pp. 2191-2195
Design of a scanning laser optical trap
for multiparticle manipulation
C. Mio, T. Gong, A. Terray, and D. W. M. Marr
pp. 2196-2200
Fluorescence measurements on nanotiter plates
M. Hessling, J. Ihlemann, and G. Marowsky
pp. 2201-2205
GRAVITY; GEOPHYSICS; ASTRONOMY and ASTROPHYSICS
Full scale prototype of high Q pendulum
for interferometric gravitational wave detectors
G. Cagnoli, L. Gammaitoni, J. Kovalik, F. Marchesoni, and M. Punturo
pp. 2206-2210
GENERAL INSTRUMENTS
A two-axis micromachined silicon actuator
with micrometer range electrostatic actuation and
picometer sensitive capacitive detection
F. Ayela, J. L. Bret, J. Chaussy, T. Fournier, and E. Ménégaz
pp. 2211-2218
Capacitance based scanner for thickness
mapping of thin dielectric films
John Graham, Marek Kryzeminski, and Zoran Popovic
pp. 2219-2223
Characteristics of fritting contacts
utilized for micromachined wafer probe cards
Toshihiro Itoh, Tadatomo Suga, Gunter Engelmann,
Jürgen Wolf, Oswin Ehrmann, and Herbert Reichl
pp. 2224-2227
Further considerations on the preparation
of small electrical contacts by spot welding
I. R. Walker and C. J. Moss
pp. 2228-2232
Rare earth optical temperature sensor
Donald L. Chubb and David S. Wolford
pp. 2233-2240
Melt velocity measurement by a
noncontacting electromagnetic probe
J. W. Suh and Z. H. Lee
pp. 2241-2245
NOTES
Raman shifting a tunable ArF laser to
wavelengths of 190-240 nm
R. Jeffrey Balla and G. C. Herring
pp. 2246-2247
Automated system for measuring optical
parameters for coherence-modulated optical links
C. Gutiérrez-Martínez and J. Rodríguez-Asomoza
pp. 2248-2249