Review of Scientific Instruments, 2004, V 75, N 4.
REVIEW ARTICLE
Viscoelastic measurement techniques
R. S. Lakes
pp. 797-810
ARTICLES
Measurement errors in the mean and fluctuation
velocities of spherical grains from a computer
analysis of digital images
Haitao Xu, Anthony P. Reeves, and Michel Y. Louge
pp. 811-819
Angle resolved microwave spectrometer for
metamaterial studies
A. F. Starr, P. M. Rye, J. J. Mock, and D. R. Smith
pp. 820-825
Simulation of high power broadband cyclotron
autoresonance maser amplifier and electron
beam experiments
D. C. Speirs, A. D. R. Phelps, I. V. Konoplev,
A. W. Cross, and W. He
pp. 826-831
Controlled deposition of picoliter amounts of fluid
using an ultrasonically driven micropipette
Bradley J. Larson, Susan D. Gillmor, and Max G. Lagally
pp. 832-836
Preparation of gold tips suitable for tip-enhanced
Raman spectroscopy and light emission by
electrochemical etching
Bin Ren, Gennaro Picardi, and Bruno Pettinger
pp. 837-841
Performance comparison and modeling of PZN, PMN,
and PZT stacked actuators in a levered flexure mechanism
Shane C. Woody and Stuart T. Smith
pp. 842-848
Frequency-stabilized single-mode cavity ring-down
apparatus for high-resolution absorption spectroscopy
Joseph T. Hodges, Howard P. Layer, William W. Miller,
and Gregory E. Scace
pp. 849-863
Development of a measurement system of peroxy radicals
using a chemical amplification/laser-induced fluorescence technique
Yasuhiro Sadanaga, Jun Matsumoto, Ken-ichi Sakurai,
Ryoko Isozaki, Shungo Kato, Tomoki Nomaguchi,
Hiroshi Bandow, and Yoshizumi Kajii
pp. 864-872
An in situ method for observing wax crystallization under pipe flow
Sarah E. Guthrie, Gianfranco Mazzanti, Tyrone N. Steer,
MacKenzie R. Stetzer, Sacha P. Kautsky, Hugh Merz,
Stefan H. J. Idziak, and Eric B. Sirota
pp. 873-877
In-plane deformation of cantilever plates with applications
to lateral force microscopy
John E. Sader and Christopher P. Green
pp. 878-883
Modified gaseous electronics conference reference cell
for the study of plasma-surface-gas interactions
M. J. Goeckner, J. M. Marquis, B. J. Markham, A. K. Jindal,
E. A. Joseph, and B.-S. Zhou
pp. 884-890
Sizing of microdrops
Irwin T. Lee, Sewan Fan, Valerie Halyo, Peter C. Kim,
Eric R. Lee, Martin L. Perl, and Howard Rogers
pp. 891-895
Shielding effect of an open-type hybrid magnetic
shield with high-Tc superconducting loops
Yusuke Seki, Daisuke Suzuki, Kuniomi Ogata,
and Keiji Tsukada
pp. 896-899
Feedback-controlled ion beam sculpting apparatus
Derek M. Stein, Ciaran J. McMullan, Jiali Li,
and Jene A. Golovchenko
pp. 900-905
Real space and Fourier microscopy of colloidal
suspensions confined to a parallel plate geometry
Ralf Biehl and Thomas Palberg
pp. 906-914
An electrolytically actuated micropump
Daniel A. Ateya, Ashish A. Shah, and Susan Z. Hua
pp. 915-920
Zero interference effect and electroabsorption
for amorphous silicon-based solar cells
Jong H. Lyou and E. A. Schiff
pp. 921-927
Diagnostic methods for time-resolved optical
spectroscopy of shocked liquid deuterium
Greg Dunham, J. E. Bailey, A. Carlson, P. Lake,
and M. D. Knudson
pp. 928-935
An x-ray confinement cell for studies of complex
fluids under shear and confinement
Brian Nieman, Xavier Commeinhes, Nathan S. Babcock,
Ivan Frola, Rick Forgett, Stefan H. J. Idziak, and Mark Sutton
pp. 936-941
Thinning of silicon-on-insulator wafers by numerically
controlled plasma chemical vaporization machining
Yuzo Mori, Kazuya Yamamura, and Yasuhisa Sano
pp. 942-946
Observation of dust stream formation produced by
low current, high voltage cathode spots
John E. Foster
pp. 947-954
Novel torsion balance based on a spherical
superconducting suspension
Giles D. Hammond, Antonio Pulido-Paton,
Clive C. Speake, and Christian Trenkel
pp. 955-961
Metrological large range scanning probe microscope
Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink,
Min Xu, Klaus Hasche, and Guenter Wilkening
pp. 962-969
Measurement of Young's modulus and Poisson's ratio
of thin coatings using impact excitation and
depth-sensing indentation
A. S. Maxwell, S. Owen-Jones, and N. M. Jennett
pp. 970-975
Theoretical analysis of the gravity-driven
capillary viscometers
Claudio L. A. Berli and Julio A. Deiber
pp. 976-982
Construction of an innovative heating apparatus
for ultrahigh vacuum platens used in high
pressure reaction cells
Esteban J. Romano and Kirk H. Schulz
pp. 983-987
Compact low-power high-sensitivity angle sensor
N. A. Lockerbie, N. J. McDonald, and R. G. Weston
pp. 988-995
A vacuum-UV laser-induced fluorescence experiment
for measurement of rotationally and vibrationally excited H2
P. Vankan, S. B. S. Heil, S. Mazouffre, R. Engeln,
D. C. Schram, and H. F. Dobele
pp. 996-999
Reentrant cavities as electromechanical transducers
J. J. Barroso, P. J. Castro, O. D. Aguiar, and L. A. Carneiro
pp. 1000-1005
Fiber-optic sensor system for heat-flux measurement
Yonghang Shen, Jinglei He, Weizhong Zhao, Tong Sun,
Kenneth T. V. Grattan, and William D. N. Pritchard
pp. 1006-1012
Operation of a 0.2–1.1 keV ion source within
a magnetized laboratory plasma
H. Boehmer, D. Edrich, W. W. Heidbrink,
R. McWilliams, L. Zhao, and D. Leneman
pp. 1013-1019
Optimization of a low-energy, high brightness
electron gun for inverse photoemission spectrometers
S. Raj and D. D. Sarma
pp. 1020-1025
Measurement of x-ray coherence using two-beam
interferometer with prism optics
Yoshio Suzuki
pp. 1026-1029
Some effects of magnetic field on a hollow
cathode ion source
E. M. Oks, A. Anders, and I. G. Brown
pp. 1030-1033
Large volume high-pressure cell with supported
moissanite anvils
Ji-an Xu, Ho-kwang Mao, Russell J. Hemley,
and Earl Hines
pp. 1034-1038
Test of collinear spectroscopy for precise
high-voltage determination
S. Gotte, K.-M. Knaak, N. Kotovski, H.-J. Kluge,
G. Ewald, and K. D. A. Wendt
pp. 1039-1050
Dual-mode CO2-laser/microwave-sideband
spectrometer with broadband and saturation
dip detection for CH3OH
Zhen-Dong Sun, Qiang Liu, R. M. Lees,
Li-Hong Xu, M. Yu. Tretyakov, and V. V. Dorovskikh
pp. 1051-1060
Highly stable atom-tracking scanning
tunneling microscopy
Pongpun Rerkkumsup, Masato Aketagawa,
Koji Takada, Yoichi Togawa, Nguyen Tien Thinh,
and Yosuke Kozuma
pp. 1061-1067
Thermal dependence of electrical characteristics
of micromachined silica microchannel plates
Anton S. Tremsin, John V. Vallerga,
Oswald H. W. Siegmund, Charles P. Beetz,
and Robert W. Boerstler
pp. 1068-1072
[
Low-pressure source of slow metastable rare gas atoms
M. H. L. van der Velden, H. Batelaan, E. te Sligte,
H. C. W. Beijerinck, and E. J. D. Vredenbregt
pp. 1073-1077
Demining with Nd:YAG laser
Thomas Rothacher, Willy Luthy,
and Heinz P. Weber
pp. 1078-1080
X-ray powder diffractometer for in situ
structural studies in magnetic fields
from 0 to 35 kOe between 2.2 and 315 K
Aaron Patrick Holm, Vitalij K. Pecharsky,
Karl A. Gschneidner, Jr., Roger Rink,
and Munir N. Jirmanus
pp. 1081-1088
Ultrahigh vacuum glancing angle deposition
system for thin films with controlled
three-dimensional nanoscale structure
Kevin Robbie, Gisia Beydaghyan, Tim Brown,
Cory Dean, Jonathan Adams, and Cristina Buzea
pp. 1089-1097
Practical thermoreflectance design for
optical characterization of layer semiconductors
Ching-Hwa Ho, Horng-Wen Lee, and Zau-Hwang Cheng
pp. 1098-1102
A dielectric slit die for in-line monitoring of
polymer compounding
Anthony J. Bur, Steven C. Roth, Yu-Hsin Lee,
and Michael McBrearty
pp. 1103-1109
Tensile testing of ultrathin polycrystalline films:
A synchrotron-based technique
J. Bohm, P. Gruber, R. Spolenak, A. Stierle,
A. Wanner, and E. Arzt
pp. 1110-1119
Development of a combined interference microscope
objective and scanning probe microscope
James W. G. Tyrrell, Claudio Dal Savio,
Rolf Kruger-Sehm, and Hans-Ulrich Danzebrink
pp. 1120-1126
Band-pass magnetostatic wave resonators on
micromachined silicon substrate
Romolo Marcelli, George Sajin, and Alina Cismaru
pp. 1127-1133
Performance of uncooled microcantilever thermal detectors
P. G. Datskos, N. V. Lavrik, and S. Rajic
pp. 1134-1148
Robust photodetector for vacuum ultraviolet laser light
Tadashi Kitahara, Yoshiro Nomoto, and Norio Ichikawa
pp. 1149-1154
NOTES
X-ray imaging microscopy using Fresnel zone
plate objective and quasimonochromatic
undulator radiation
Yoshio Suzuki, Akihisa Takeuchi, Hidekazu Takano,
Kentaro Uesugi, Toshihiko Oka, and Katsuaki Inoue
pp. 1155-1157
A digitally programmable capacitance standard
Yicheng Wang and Lai Lee
pp. 1158-1160