Review of Scientific Instruments. 1998, V 69, N 4, Apr.

  CHARGE-COUPLED DEVICES AS PARTICLE TRACKING DETECTORS. [Review]     
  Damerell CJS.
  pp 1549-1573
   
  HIGH-FREQUENCY MODULATION OF THE FOUR STATES OF POLARIZATION
  OF LIGHT WITH  A SINGLE PHASE MODULATOR. 
  Compain E; Drevillon B.
  pp 1574-1580
   
  A COMPACT, INTENSE, MONOCHROMATIC, ATMOSPHERIC PRESSURE, EXTREME
  ULTRAVIOLET LIGHT SOURCE. 
  Scime EE; Balkey MM.
  pp 1581-1583
   
  EFFECT OF LASER BEAM DEFLECTION ON THE ACCURACY OF INTERFEROMETER
  MEASUREMENTS. 
  Lisitsyn IV; Kohno S; Katsuki S; Akiyama H.
  pp 1584-1586
   
  INTEGRATED SCATTER PLATE AND PROJECTION LENS FOR SCATTER PLATE
  INTERFEROMETER. 
  Rasanen JT; Peiponen KE; Abedin KM; Tenjimbayashi K; Eiju T; Matsuda K.
  pp 1587-1590
   
  STABILIZED RECORDING AND THERMAL FIXING OF HOLOGRAMS IN 
  PHOTOREFRACTIVE  LITHIUM NIOBATE CRYSTALS. 
  Breer S; Buse K; Peithmann K; Vogt H; Kratzig E.
  pp 1591-1594
   
  DIGITAL CROSS-CORRELATION TECHNIQUE FOR FLUORESCENCE-LIFETIME 
  MEASUREMENT USING A RADIONUCLIDE-SCINTILLATION EXCITATION SOURCE. 
  Burden DL; Hieftje GM.
  pp 1595-1604
   
  A METHOD TO IMPROVE THE NONREPETITIVE ACQUISITION OF TRANSIENT ABSORPTION
  SPECTRA WITH AN INTENSIFIED CHARGE-COUPLED DEVICE CAMERA.    
  Baldacchino G; Hickel B.
  pp 1605-1609
   
  A SIMPLE SPHERICAL GRATING BY-PASS MONOCHROMATOR DEDICATED TO SOFT X-RAY
  EMISSION SPECTROSCOPY. 
  Ghiringhelli G; Tagliaferri A; Braicovich L; Brookes NB.
  pp 1610-1615
   
  A TWO-INCH DC/RF CIRCULAR MAGNETRON SPUTTERING GUN FOR A MINIATURE
  CHAMBER  FOR AN IN SITU EXPERIMENT. 
  Rue GH; Kim HK.
  pp 1616-1621
   
  A NEW CONCEPT MINIATURE CHARGE COUPLED DEVICE CAMERA FOR VACUUM
  ULTRAVIOLET AND SOFT X-RAYS SPECTROSCOPY. 
  Pace E; Tommasi L.
  pp 1622-1628
   
  EXTENDING A CONTINUOUS SCAN FOURIER TRANSFORM SPECTROMETER FOR
  TIME-RESOLVED FOURIER TRANSFORM SPECTROSCOPY WITH LESS-THAN-0.5CM(-1)
  SPECTRAL AND LESS-THAN-10NS TIME RESOLUTION IN THE VISIBLE REGION.
   Lindner J; Stahlhut O; Wilhelm R; Ermisch K.
  pp 1629-1636
   
  A SIMPLE SCANNING MIRROR MECHANISM FOR A FOURIER TRANSFORM SPECTROMETER.
  Brasunas JC; Cushman GM.
  pp 1637-1641
   
  NEW LOW BACKGROUND CROSSED MOLECULAR BEAM APPARATUS - LOW 
  BACKGROUND  DETECTION OF H-2. 
  Lin JJ; Hwang DW; Harich S; Lee YT; Yang XM.
  pp 1642-1646
   
  TIME-OF-FLIGHT ANALYSIS OF NEUTRAL CLUSTER BEAMS THROUGH DETECTION OF
  CHARGED PARTICLES PRODUCED BY CLUSTER IMPACT ON A CHANNELTRON.
  Piseri P; Libassi A; Milani P.
  pp 1647-1649
   
  IN-SERIES COMBINATION OF A MAGNETIC-SECTOR MASS SPECTROMETER WITH A
  TIME-OF-FLIGHT QUADRATIC-FIELD ION MIRROR. 
  Andersen UN; Colburn AW; Makarov AA; Raptakis EN; Reynolds DJ; Derrick PJ;
  Davis SC; Hoffman AD; Thomson S.
  pp 1650-1660
   
  A HIGH RESOLUTION DUAL MASS GATE FOR ION SEPARATION IN LASER
  DESORPTION/IONIZATION TIME OF FLIGHT MASS SPECTROMETRY.     
  Stoermer CW; Gilb S; Friedrich J; Schooss D; Kappes MM.
  pp 1661-1664
   
  IMPROVED TWO-DIMENSIONAL PRODUCT IMAGING - THE REAL-TIME ION-COUNTING
  METHOD. 
  Chang BY; Hoetzlein RC; Mueller JA; Geiser JD; Houston PL.
  pp 1665-1670
   
  A NEW TOROIDAL ELECTROSTATIC ANALYZER AND APPLICATION TO SURFACE 
  ANALYSIS.
  Nishimura T; Ikeda A; Kido Y.
  pp 1671-1675
   
  SCATTERING AND RECOILING IMAGING SPECTROMETER (SARIS).     
  Kim C; Hofner C; Albayati A; Rabalais JW.
  pp 1676-1684
   
  EXPERIMENTAL STUDY ON AN ELECTRON-BEAM ENERGY RECOVERY SYSTEM USING 
  A  MULTISTAGE COLLECTOR. 
  Roy PK; Moon A; Mima K; Nakai S; Fujita M; Imasaki K; Yamanaka C; Tanaka
  H; Sano E; Tsunawaki Y.
  pp 1685-1687
   
  INDIRECTLY HEATED CATHODE ARC DISCHARGE SOURCE FOR ION IMPLANTATION
  OF  SEMICONDUCTORS. 
  Horsky TN.
  pp 1688-1690
   
  NUMERICAL STUDY OF MICROWAVE REFLECTOMETRY IN PLASMAS WITH TWO-  DIMENSIONAL  TURBULENT FLUCTUATIONS. 
  Mazzucato E.
  pp 1691-1698
   
  DIAGNOSIS OF ELECTRON DENSITY IN MAGNETIZED PLASMAS USING LOWER HYBRID
  WAVES. 
  Sheehan DP.
  pp 1699-1701
   
  DETERMINATION OF THE D/T FUEL MIXTURE USING TWO-PHOTON LASER INDUCED
  FLUORESCENCE IN COMBINATION WITH NEUTRAL BEAM INJECTION.     
  Voslamber D; Mandl W.
  pp 1702-1715
   
  APPLICATION OF SINGULAR VALUE DECOMPOSITION IN AVERAGE TEMPERATURE
  MEASUREMENT USING FLUORESCENCE DECAY TECHNIQUES. 
  Sun T; Zhang ZY; Grattan KTV; Palmer AW.
  pp 1716-1723
   
  APPLICATION OF SOUND-ABSORBENT PLASTIC TO WEAK-SHOCK-WAVE ATTENUATORS.
  Ootsuta K; Matsuoka K; Sasoh A; Takayama K.
  pp 1724-1729
   
  SENSITIVE OPTICAL DETECTION OF THE SHOCK FRONT AND FAST MOVING SURFACE FOR
  SHOCK STUDY IN CONDENSED MEDIA IN THE 1 GPA STRESS REGION.
  Mori Y; Tamura T; Nagayama K.
  pp 1730-1734
   
  A REFLECTION-MODE APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPE
  DEVELOPED FROM A COMMERCIAL SCANNING PROBE MICROSCOPE.    
  Wurtz G; Bachelot R; Royer P.
  pp 1735-1743
   
  PIEZOELECTRIC SHEAR FORCE DETECTION - A GEOMETRY AVOIDING CRITICAL TIP
  TUNING FORK GLUING. 
  Salvi J; Chevassus P; Mouflard A; Davy S; Spajer M; Courjon D; Hjort K;
  Rosengren L.
  pp 1744-1746
   
  EVALUATION OF THERMAL EVAPORATION CONDITIONS USED IN COATING ALUMINUM ON
  NEAR-FIELD FIBER-OPTIC PROBES. 
  Hollars CW; Dunn RC.
  pp 1747-1752
   
  THEORETICAL AND EXPERIMENTAL STUDIES OF VIBRATIONS OF OPTICAL FIBER
  CANTILEVERS FOR ATOMIC FORCE MICROSCOPY. 
  Zhu R.
  pp 1753-1756
   
  CHARACTERIZATION OF TIPS FOR CONDUCTING ATOMIC FORCE MICROSCOPY IN
  ULTRAHIGH VACUUM. 
  Lantz MA; Oshea SJ; Welland ME.
  pp 1757-1764
   
  NEW DESIGN OF A VARIABLE-TEMPERATURE ULTRAHIGH VACUUM SCANNING TUNNELING
  MICROSCOPE. 
  Mugele F; Rettenberger A; Boneberg J; Leiderer P.
  pp 1765-1769
   
  DIGITAL LINEARIZATION AND CANCELLATION OF CAPACITIVE COUPLING FOR A
  SCANNING TUNNELING MICROSCOPE. 
  Paillard B; Tang R; Rowntree P.
  pp 1770-1780
   
  SCANNING FORCE MICROSCOPE AND VACUUM CHAMBER FOR THE STUDY OF ICE FILMS -
  DESIGN AND FIRST RESULTS. 
  Bluhm H; Pan SH; Xu L; Inoue T; Ogletree DF; Salmeron M.
  pp 1781-1784
   
  A PRECISION PIEZODRIVEN MICROPOSITIONER MECHANISM WITH LARGE TRAVEL RANGE.
  Chang SH; Du BC.
  pp 1785-1791
   
  THE USE OF A HIGH-PRESSURE SCANNING TUNNELING MICROSCOPE AS A LITHOGRAPHY
  TOOL FOR MODIFICATIONS OF AMORPHOUS HYDROGENATED CARBON FILMS.     
  Schwank M; Muller U; Wintermantel E.
  pp 1792-1799
   
  ROTATING-COMPENSATOR MULTICHANNEL ELLIPSOMETRY - APPLICATIONS FOR REAL
  TIME STOKES VECTOR SPECTROSCOPY OF THIN FILM GROWTH. 
  Lee J; Rovira PI; An I; Collins RW.
  pp 1800-1810
   
  A SETUP COMBINING FOUR-POINT PROBE AND SURFACE MAGNETO-OPTICAL KERR EFFECT
  FOR MEASUREMENTS OF MAGNETOTRANSPORT AND MAGNETIC PROPERTIES OF ULTRATHIN
  FILMS IN ULTRAHIGH VACUUM. 
  Li M; Wang GC.
  pp 1811-1813
   
  A DIRECT METHOD OF EXTRACTING SURFACE RECOMBINATION VELOCITY FROM AN
  ELECTRON BEAM INDUCED CURRENT LINE SCAN. 
  Ong VKS.
  pp 1814-1816
   
  A SENSITIVE BROADBAND HIGH-FREQUENCY ELECTRON SPIN RESONANCE ELECTRON
  NUCLEAR DOUBLE RESONANCE SPECTROMETER OPERATING AT 5-7.5 MM WAVELENGTH.
   Seck M; Wyder P.
  pp 1817-1822
   
  A HIGH-PRESSURE CELL FOR OPTICAL MICROSCOPY AND MEASUREMENTS ON THE PHASE
  DIAGRAM OF POLY(DIETHYLSILOXANE). 
  Reck T; Sautter E; Dollhopf W; Pechhold W.
  pp 1823-1827
   
  NEW SAMPLE PREPARATION FOR QUANTITATIVE LASER DESORPTION MASS
  SPECTROMETRY  AND OPTICAL SPECTROSCOPY. 
  Haefliger OP; Zenobi R.
  pp 1828-1832
   
  A NEW SPUTTERING DEVICE OF RADIO-FREQUENCY MAGNETRON DISCHARGE USING A
  RECTANGULAR HOLLOW-SHAPED ELECTRODE. 
  Ohtsu Y; Tsurume Y; Fujita H.
  pp 1833-1836
   
  A NEW DESIGN FOR STUDY ON REACTIVITY OF CLUSTERS. 
  Zhen G; Peng L.
  pp 1837-1839
   
  ELECTROCHEMICAL CELL FOR IN SITU X-RAY DIFFRACTION UNDER ULTRAPURE
  CONDITIONS. 
  Koop T; Schindler W; Kazimirov A; Scherb G; Zegenhagen J; Schulz T;
  Feidenhansl R; Kirschner J.
  pp 1840-1843
   
  A MICROPROCESSOR CONTROLLED PH POTENTIOMETRIC APPARATUS FOR TITRATIONS IN
  SLOW EQUILIBRIUM CHEMICAL PROCESSES. 
  Volpicelli R; Zompa LJ.
  pp 1844-1846
   
  LOW-VOLTAGE OPERATION OF A PLASMA REACTOR FOR EXHAUST GAS TREATMENT BY
  DIELECTRIC BARRIER DISCHARGE. 
  Jani MA; Takaki K; Fujiwara T.
  pp 1847-1849
   
  DESIGN OF A LABORATORY SCALE FLUIDIZED BED REACTOR. 
  Wikstrom E; Andersson P; Marklund S.
  pp 1850-1859
   
  A COMBINED LONG-TERM RECORDING SYSTEM FOR SINGLE-UNIT ACTIVITY AND
  NEUROTRANSMITTER EFFLUX OF A BRAIN SLICE. 
  Sheu YH; Young MS.
  pp 1860-1868
   
  A BROADBAND PULSED RADIO FREQUENCY ELECTRON PARAMAGNETIC RESONANCE
  SPECTROMETER FOR BIOLOGICAL APPLICATIONS. 
  Murugesan R; Afeworki M; Cook JA; Devasahayam N; Tschudin R; Mitchell JB;
  Subramanian S; Krishna MC.
  pp 1869-1876
   
  LOW-COHERENCE LOCK-IN INTERFEROMETER FOR OPHTHALMOLOGY.     
  Oliveira AC; Yasuoka FMM; Santos JB; Carvalho LAV; Castro JC.
  pp 1877-1881
   
  AN INTERFEROMETRIC DEVICE TO MEASURE THE MECHANICAL TRANSFER 
  FUNCTION OF  THE VIRGO MIRRORS SUSPENSIONS. 
  Calloni E; Difiore L; Grado A; Milano L.
  pp 1882-1885
   
  DESTRUCTION OF HAZARDOUS AIR POLLUTANTS USING A FAST RISE TIME PULSED
  CORONA REACTOR. 
  Korzekwa RA; Grothaus MG; Hutcherson RK; Roush RA; Brown R.
  pp 1886-1892
   
  A MINIATURE METAL-CERAMIC X-RAY SOURCE FOR SPACECRAFT INSTRUMENTATION.
  Koppel LN; Marshall JR.
  pp 1893-1897
   
  STABILITY COEFFICIENTS FOR THE MULTIANODE MICROCHANNEL ARRAY DETECTOR.
  Joseph CL; Bybee R; Argabright V.
  pp 1898-1905
   
  A SIMPLE ULTRAVIOLET RADIATION-TRIGGERED SWITCH WITH AN ELECTRIC FIELD
  DISTORTION GAP FOR LONG-LIFETIME ELECTRODES. 
  Niedbalski J.
  pp 1906-1908
   
  A PROGRAMMABLE PRESCALER FOR MINIMIZING COUNTING ERRORS WITH 
  PC-BASED DATA  ACQUISITION CARDS. 
  Mccabe PR; Utz AL.
  pp 1909-1913
   
  TRANSVERSE MODE SELECTION IN A LONGITUDINAL CONTINUOUS WAVE CO2 
  LASER WITH  A NOMINAL POWER OF 125 W. 
  Alhawat S; Alsadat W.
  pp 1914-1915
   
  SIMPLE DEVICE FOR MONITORING SECONDARY ELECTRON EMISSION OF
  MATERIALS IN  THE PULSE MODE. 
  Krainsky IL; Lesny GG.
  pp 1916-1917
   
  ION ENERGY AND MASS ANALYZER AT RADIO FREQUENCY ELECTRODE IN
  A PLASMA  CHAMBER. 
  Mizutani N; Nagata Y; Kubo A; Hayashi T.
  pp 1918-1919