Review of Scientific Instruments. 1998, V 69, N 3, Mar.

ISSN 0034-6748
  HIGH POWER ULTRAFAST LASERS. [Review]  
  Backus S; Durfee CG; Murnane MM; Kapteyn HC.
  pp 1207-1223
   
  HIGH RESOLUTION REFLECTIVITY DIFFRACTOMETER ON STATION 2.3 (DARESBURY
  LABORATORY).  
  Tang CC; Collins SP; Murphy BM; Telling ND; Wogelius RA; Teat SJ.
  pp 1224-1229
   
  A LOW-COST AND FLEXIBLE DOUBLE-CRYSTAL MONOCHROMATOR FOR AN X-RAY
  BEAMLINE.  
  Hwang CS; Lin FY; Lee CH; Yu KL; Hsieh CH; Tseng PK; Lin JT; Pong WF.
  pp 1230-1235
   
  A SIMPLE EXTENDED-CAVITY DIODE LASER.  
  Arnold AS; Wilson JS; Boshier MG.
  pp 1236-1239
   
  SINGLE PULSE SELECTION FROM A CW MODE-LOCKED LASER.  
  Nampoothiri AVV; Kundu T; Singh BP.
  pp 1240-1242
   
  THERMO-OPTICAL AND DIELECTRIC CONSTANTS OF LASER DYE SOLVENTS.  
  Elkashef H.
  pp 1243-1245
   
  OPTICAL INTERFEROMETRIC SIGNAL GENERATOR BASED ON ELECTRICAL PHASE-LOCKED
  LOOP TECHNIQUE.  
  Chang LW; Lee CT; Chien PY.
  pp 1246-1252
   
  A NEW OPTICAL OSCILLOSCOPE.  
  Li SH; Niu HB; Yang QL; Zhang HW; Guo BP; Zhou JL.
  pp 1253-1256
   
  DOUBLE-MODULATION ELECTRO-OPTIC SAMPLING FOR PUMP-AND-PROBE ULTRAFAST
  CORRELATION MEASUREMENTS.  
  Frolov SV; Vardeny ZV.
  pp 1257-1260
   
  PHOTOREFLECTANCE SPECTROSCOPY WITH WHITE LIGHT PUMP BEAM.  
  Ghosh S; Arora BM.
  pp 1261-1266
   
  SOFT X-RAY FLUORESCENCE SPECTROMETER USING A MULTILAYER INTERFERENTIAL
  TRANSMISSION PLATE.  
  Andre JM.
  pp 1267-1269
   
  CLUSTER FORMATION AND URANIUM PHOTOIONIZATION IN THE AFTERGLOW OF A PULSED
  HOLLOW CATHODE LAMP.  
  Neri JW; Silveira CAB; Rodrigues NAS; Schwab C; Riva R; Destro MG; Mirage
  A.
  pp 1270-1274
   
  DESIGN AND PERFORMANCE OF AN ELECTROSPRAY ION SOURCE FOR MAGNETIC-SECTOR
  MASS SPECTROMETERS.  
  Belov ME; Colburn AW; Derrick PJ.
  pp 1275-1281
   
  MEASUREMENTS OF DEAD TIME AND CHARACTERIZATION OF ION COUNTING SYSTEMS FOR
  MASS SPECTROMETRY.  
  Fahey AJ.
  pp 1282-1288
   
  TIME-RESOLVING, POSITION-SENSITIVE DETECTION SYSTEM FOR SCATTERING AND
  RECOILING IMAGING SPECTROMETRY.  
  Kim C; Albayati A; Rabalais JW.
  pp 1289-1292
   
  A SIMPLE DESIGN OF SEXTUPOLE MAGNETS WITH OPTIMIZED CIRCULAR POLE FACES.
  Sarma PR; Bhandari RK.
  pp 1293-1294
   
  A 3.9 MEV PHOTOINJECTOR AND DELAY SYSTEM FOR WAKEFIELD MEASUREMENTS.
  Power JG; Conde ME.
  pp 1295-1297
   
  TIME-RESOLVED STUDY OF THE NEGATIVE ION DENSITY IN A VOLUME H- ION SOURCE
  BY PHOTODETACHMENT.  
  Hamabe M; Oka Y; Tsumori O; Kuroda T; Bacal M.
  pp 1298-1301
   
  ELECTRON CYCLOTRON RESONANCE SOURCES - HISTORICAL REVIEW AND FUTURE
  PROSPECTS (INVITED).  
  Geller R.
  pp 1302-1310
   
  DESIGN ASPECTS OF A COMPACT, SINGLE-FREQUENCY, PERMANENT-MAGNET ELECTRON
  CYCLOTRON RESONANCE ION SOURCE WITH A LARGE UNIFORMLY DISTRIBUTED RESONANT
  PLASMA VOLUME.  
  Liu Y; Alton GD; Mills GD; Reed CA; Haynes DL.
  pp 1311-1315
   
  ION SOURCES FOR FISSION FRAGMENT ACCELERATORS.  
  Koster U; Kester O; Habs D.
  pp 1316-1321
   
  PRODUCTION OF MULTICHARGED RADIOACTIVE ION BEAMS - NEW RESULTS FOR THE
  1+-]N+ METHOD WITH THE MINIMAFIOS AND SARA-CAPRICE ELECTRON CYCLOTRON
  RESONANCE ION SOURCES.  
  Lamy T; Bruandet JF; Chauvin N; Curdy JC; Fruneau M; Geller R; Gimond G;
  Sole P; Vieuxrochas JL; Gaubert G; Maunoury L; Sortais P; Villari ACC.
  pp 1322-1326
   
  THE ELECTRON-BEAM PLASMA ION SOURCE AS SOURCE OF NEGATIVE FLUORINE.
  Alton GD; Welton RF; Murray SN; Cui B.
  pp 1327-1331
   
  ION CHARGE STATE DISTRIBUTIONS OF PULSED VACUUM ARC PLASMAS IN STRONG
  MAGNETIC FIELDS.  
  Anders A; Yushkov G; Oks E; Nikolaev A; Brown I.
  pp 1332-1335
   
  INVESTIGATIONS ON LIQUID ALLOY ION SOURCES FOR RARE-EARTH ELEMENTS.
  Machalett F; Wesch W; Muhle R; Barth S.
  pp 1336-1339
   
  CHARACTERIZATION OF A LOW-ENERGY CONSTRICTED-PLASMA SOURCE.  
  Anders A; Kuhn M.
  pp 1340-1343
   
  CONCEPTUAL DESIGN OF A HELICON ION SOURCE FOR HIGH-CURRENT DC
  ACCELERATORS.  
  Hwang YS; Hong IS; Eom GS.
  pp 1344-1348
   
  OBSERVATION OF DIFFERENT TA AND PT ION GROUPS PRODUCED BY LASER RADIATION
  WITH THE INTENSITIES OF I-LAMBDA(2)SIMILAR-TO-10(15) W CM(-2) MU-M(2).
  Mroz W; Laska L; Krasa J; Kralikova B; Masek K; Pfeifer M; Rohlena K;
  Skala J; Parys P; Wolowski J; Woryna E; Fry D; Stockli MP.
  pp 1349-1352
   
  A MICROBEAM CS ION SOURCE FOR ACCELERATOR MASS SPECTROMETRY.  
  Sie SH; Niklaus TR; Suter GF; Bruhn F.
  pp 1353-1358
   
  TRANSPORTATION OF INTENSIVE ION BEAMS (INVITED).  
  Soloshenko IA.
  pp 1359-1366
   
  MEASUREMENT OF ION CHARGE STATE DISTRIBUTIONS INSIDE ELECTRON CYCLOTRON
  RESONANCE NEON AND CHLORINE PLASMAS BY X-RAY SPECTROSCOPY.  
  Grubling P; Kuchler D; Ullrich A; Werner T; Zschornack G.
  pp 1367-1371
   
  IMPROVEMENTS TO FLOATING DOUBLE PROBE FOR TIME-RESOLVED MEASUREMENTS IN
  PULSED RF PLASMAS.  
  Smith BA; Overzet LJ.
  pp 1372-1377
   
  ELECTRON TEMPERATURE ESTIMATION IN THE SAHA-INSTITUTE-OF-NUCLEAR-PHYSICS
  TOKAMAK FROM THE SOFT X-RAY IMAGING SYSTEM.  
  Paul RK; Banik D; Iyengar ANS; Hui AK.
  pp 1378-1382
   
  SPHERICITY ANALYSIS OF SOLID DENSITY STANDARDS.  
  Giardini WJ; Mana G.
  pp 1383-1390
   
  A COUNTER-ROTATING COUETTE APPARATUS TO STUDY DEFORMATION OF A
  SUB-MILLIMETER SIZED PARTICLE IN SHEAR FLOW.  
  Dehaas KH; Vandenende D; Blom C; Altena EG; Beukema GJ; Mellema J.
  pp 1391-1397
   
  DETECTION OF SMALL QUANTITIES OF GASEOUS CONTAMINATION IN A GAS BY USING A
  DIFFERENTIAL OPTICAL METHOD.  
  Djaozandry R; Starnaud JM; Bose TK; Frechette MF.
  pp 1398-1402
   
  A TWO-DIMENSIONAL ULTRAHIGH VACUUM POSITIONER FOR SCANNING TUNNELING
  MICROSCOPY.  
  Pond K; Nosho BZ; Stuber HR; Gossard AC; Weinberg WH.
  pp 1403-1405
   
  A NOVEL LOW PROFILE ATOMIC FORCE MICROSCOPE COMPATIBLE WITH OPTICAL
  MICROSCOPES.  
  Nakano K.
  pp 1406-1409
   
  MEASUREMENT OF FORCES AND SPRING CONSTANTS OF MICROINSTRUMENTS.  
  Saif MTA; Macdonald NC.
  pp 1410-1422
   
  A MULTIPURPOSE MINIATURE PISTON-CYLINDER DIAMOND-ANVIL CELL FOR PRESSURES
  BEYOND 100 GPA.  
  Machavariani GY; Pasternak MP; Hearne GR; Rozenberg GK.
  pp 1423-1425
   
  ADVANCES IN THE USE OF LASER-FLASH TECHNIQUES FOR THERMAL DIFFUSIVITY
  MEASUREMENT.  
  Sheindlin M; Halton D; Musella M; Ronchi C.
  pp 1426-1436
   
  NEW SEQUENTIAL METHOD TO PROCESS NOISY TEMPERATURE RESPONSE FROM FLASH
  EXPERIMENT MEASURED BY INFRARED CAMERA.  
  Mourand D; Gounot J; Batsale JC.
  pp 1437-1440
   
  FALLING CAPILLARY TUBE VISCOMETER SUITABLE FOR LIQUIDS AT HIGH PRESSURE.
  Kumagai A; Kawase Y; Yokoyama C.
  pp 1441-1445
   
  A NEW BREWSTER ANGLE MICROSCOPE.  
  Lheveder C; Henon S; Mercier R; Tissot G; Fournet P; Meunier J.
  pp 1446-1450
   
  NONLINEAR RESPONSE OF TYPE II SUPERCONDUCTORS - A NEW METHOD OF MEASURING
  THE PRESSURE DEPENDENCE OF THE TRANSITION TEMPERATURE T-C(P).  
  Raphael MP; Reeves ME; Skelton EF.
  pp 1451-1455
   
  LONGITUDINAL DETECTION OF PULSED LOW-FREQUENCY, LOW-TEMPERATURE NUCLEAR
  MAGNETIC RESONANCE USING A DC SQUID.  
  Wurm M; Brison JP; Flouquet J.
  pp 1456-1462
   
  HIGH-PRESSURE LIGHT SCATTERING APPARATUS TO STUDY PRESSURE-INDUCED PHASE
  SEPARATION IN POLYMER SOLUTIONS.  
  Xiong Y; Kiran E.
  pp 1463-1471
   
  DIRECT MEASUREMENT OF REFRACTIVE-INDEX DISPERSION USING A TIME-DELAYED
  TECHNIQUE.  
  Lin SY; Wang L; Zubrzycki W.
  pp 1472-1475
   
  IMAGING CONOSCOPE FOR INVESTIGATION OF OPTICAL INHOMOGENEITY IN LARGE
  BOULES OF UNIAXIAL CRYSTALS.  
  Bajor AL; Salbut L; Szwedowski A; Piatkowski T.
  pp 1476-1487
   
  THICKNESS AND CONDUCTIVITY DETERMINATION OF THIN NONMAGNETIC COATINGS ON
  FERROMAGNETIC CONDUCTIVE SUBSTRATES USING SURFACE COILS.  
  Ptchelintsev A; Dehalleux B.
  pp 1488-1494
   
  A NOVEL DISTRIBUTED SYSTEM FOR PLASMA IMMERSION ION IMPLANTER CONTROL AND
  AUTOMATION.  
  Liu AG; Wang XF; Tang BY; Chu PK; Ko PK; Cheng YC.
  pp 1495-1498
   
  A MODIFIED BROAD BEAM ION SOURCE FOR LOW-ENERGY HYDROGEN IMPLANTATION.
  Otte K; Schindler A; Bigl F; Schlemm H.
  pp 1499-1504
   
  PHOTOMODULATED THERMOREFLECTANCE DETECTION OF HYDROGEN GAS USING OPTICALLY
  THIN PALLADIUM FILM ON SILICON OXIDE.  
  Kalli K; Othonos A; Christofides C; Lundstrom I.
  pp 1505-1511
   
  MULTIDIMENSIONAL FLUORESCENCE SPECTROSCOPY USING A STREAK CAMERA BASED
  PULSE FLUOROMETER.  
  Buhler CA; Graf U; Hochstrasser RA; Anliker M.
  pp 1512-1518
   
  TWO TYPES OF ION GUN EQUIPPED SPUTTER-INITIATED RESONANT IONIZATION AND
  TIME-OF-FLIGHT MASS SPECTROSCOPY AND ITS APPLICATION IN MICROANALYSIS OF
  MINERALS.  
  Jin L; Dai ST; Dong GX; Li CM; Wang SL; Tian JH; Chen DY.
  pp 1519-1522
   
  APPLICATION OF A NEW NONCRYOGENIC X-RAY DETECTOR IN PORTABLE INSTRUMENTS
  FOR ARCHAEOMETRIC ANALYSES.  
  Fiorini C; Longoni A.
  pp 1523-1528
   
  NOVEL GAS-DOPING TECHNIQUE FOR LOCAL SPECTROSCOPIC MEASUREMENTS IN
  PULSED-POWER SYSTEMS.  
  Arad R; Ding L; Maron Y.
  pp 1529-1533
   
  A FACILITY FOR ELECTRICAL CONTACT RESISTANCE MEASUREMENT.  
  Maheshappa HD; Nagaraju J; Krishnamurthy MV.
  pp 1534-1536