Review of Scientific Instruments.
1997, V 68, N 12, Dec.
ISSN 0034-6748
FIBER BRAGG GRATINGS. [Review]
Othonos A. p 4309-4341
DESIGN OF A SHORT-PULSE, FAR-INFRARED FREE ELECTRON LASER WITH A HIGHLY
OVERMODED WAVEGUIDE.
Lin LY; Vandermeer AFG. p 4342-4347
DIAGNOSIS OF RELATIVISTIC ELECTRON BEAMS USING A FREE ELECTRON LASER
AMPLIFIER.
Ciocci F; Dattoli G. p 4348-4350
MIDINFRARED FREE ELECTRON LASER POWER DELIVERY THROUGH A CHALCOGENIDE
GLASS FIBER.
Awazu K; Ogino S; Nagai A; Tomimasu T; Morimoto S. p 4351-4352
A NOVEL SCHEME OF LASER INTERFEROMETER-REFRACTOMETER WITH HIGH SPATIAL AND
TEMPORAL RESOLUTIONS.
Lisitsyn IV; Kohno S; Akiyama H. p 4353-4356
WIDE-DYNAMIC-RANGE DIGITAL CORRELATOR USING FIELD PROGRAMMABLE GATE
ARRAYS.
Kinoshita J; Matsumoto M; Aoki T. p 4357-4358
TEMPERATURE PROGRAMMED DESORPTION MASS SPECTROMETER WITH SUPERSONIC
MOLECULAR BEAM INLET SYSTEM.
Danon A; Avraham I; Koresh JE. p 4359-4363
CONSTRUCTION OF A SUBPICOSECOND DOUBLE-BEAM LASER PHOTOLYSIS SYSTEM
UTILIZING A FEMTOSECOND TI-SAPPHIRE OSCILLATOR AND THREE TI-SAPPHIRE
AMPLIFIERS (A REGENERATIVE AMPLIFIER AND TWO DOUBLE PASSED LINEAR
AMPLIFIERS), AND MEASUREMENTS OF THE TRANSIENT ABSORPTION SPECTRA BY A
PUMP-PROBE METHOD.
Nakayama T; Amijima Y; Ibuki K; Hamanoue K. p 4364-4371
A SYNCHROTRON X-RAY LIQUID SURFACE SPECTROMETER.
Schlossman ML; Synal D; Guan YM; Meron M; Sheamccarthy G;
Huang ZQ; Acero A; Williams SM; Rice SA; Viccaro PJ. p 4372-4384
A NEW COMPACT 60 KV MOTT POLARIMETER FOR SPIN POLARIZED ELECTRON
SPECTROSCOPY.
Petrov VN; Landolt M; Galaktionov MS; Yushenkov BV. p 4385-4389
A NEW COMPACT ELECTRON SPIN POLARIMETER WITH A HIGH EFFICIENCY.
Qiao S; Kimura A; Harasawa A; Sawada M; Chung JG; Kakizaki A.
p 4390-4395
PREPARATION OF ULTRATHIN FREE-STANDING TARGETS FOR (E,2E) SPECTROSCOPY.
Fang Z; Guo X; Utteridge S; Canney SA; Mccarthy IE; Vos M; Weigold E.
p 4396-4403
DESIGN STUDY AND EXPERIMENTAL PERFORMANCE OF A MULTISTAGE ELECTRON
COLLECTOR.
Roy PK; Moon A; Ohkubo K; Nakao N; Mima K; Nakai S; Fujita M;
Imasaki K; Yamanaka C; Sano E; Tsunawaki Y. p 4404-4408
ANALYTICAL AND NUMERICAL COMPUTATION OF MULTIPOLE COMPONENTS OF MAGNETIC
DEFLECTORS.
Lenc M; Lencova B. p 4409-4414
GAS-DISCHARGE NEUTRALIZER FOR ION-BEAM SYSTEM.
Bizyukov AA; Kashaba AY; Sereda KN. p 4415-4417
A COMPLEX PROBE FOR MEASUREMENTS OF TURBULENCE IN THE EDGE OF MAGNETICALLY
CONFINED PLASMAS.
Castro RM; Heller MVAP; Dasilva RP; Caldas IL; Degasperi FT;
Nascimento IC. p 4418-4423
DOUBLE WINDOW CONFIGURATION AS A LOW COST MICROWAVE WAVEGUIDE WINDOW FOR
PLASMA APPLICATIONS.
Baskaran R. p 4424-4426
A NONDISTURBING ELECTRIC-FIELD SENSOR USING PIEZOELECTRIC AND CONVERSE
PIEZOELECTRIC RESONANCES.
Lee Y; Kim I; Lee S. p 4427-4430
EFFECT OF BROADBAND WAVE NUMBER AND FREQUENCY SPECTRA ON EXB PARTICLE FLUX
IN PLASMAS.
Crowley TP. p 4431-4433
APPLICATION OF A SI-DIODE DETECTOR FOR FUSION PRODUCT MEASUREMENTS IN
ASDEX UPGRADE.
Ullrich W; Bosch HS; Hoenen F. p 4434-4438
THE ELECTRON CYCLOTRON ABSORPTION DIAGNOSTIC AT THE RIJNHUIZEN TOKAMAK
PROJECT.
Vangelder JFM; Miedema HS; Donne AJH; Oomens AAM; Schuller FC.
p 4439-4447
NEW EXTRUDER-BASED DEUTERIUM FEED SYSTEM FOR CENTRIFUGE PELLET INJECTION.
Combs SK; Foust CR. p 4448-4457
MAXIMUM ENTROPY DIGITAL SIGNAL PROCESSING FOR ACOUSTIC DOPPLER IMAGING.
Wright F. p 4458-4461
ACOUSTICAL MEASUREMENT OF THE TRAPPING CONSTANT OF POROUS MATERIALS.
Debray A; Allard JF; Lauriks W; Kelders L. p 4462-4464
STUDY ON THE TEMPERATURE SENSING CAPABILITY OF A LIGHT-EMITTING DIODE.
Acharya YB; Vyavahare PD. p 4465-4467
A STROBOSCOPIC SCANNING SOLID IMMERSION LENS MICROSCOPE.
Stotz JAH; Freeman MR. p 4468-4477
SHEAR-FORCE DETECTION BASED ON AN EXTERNAL CAVITY LASER INTERFEROMETER FOR
A COMPACT SCANNING NEAR FIELD OPTICAL MICROSCOPE.
Pfeffer M; Lambelet P; Marquisweible F. p 4478-4482
TRANSIENT RESPONSES OF A PIEZOELECTRIC TUBE SCANNER.
Yang SY; Huang WH. p 4483-4487
FLOATING ELECTROMETER FOR SCANNING TUNNELING MICROSCOPE APPLICATIONS IN
THE FEMTOAMPERE RANGE.
Heer R; Eder C; Smoliner J; Gornik E. p 4488-4491
IN SITU GENERATION AND ATOMIC SCALE IMAGING OF SLIP TRACES WITH ATOMIC
FORCE MICROSCOPY.
Oele WF; Kerssemakers JWJ; Dehosson JTM. p 4492-4497
LOCALIZED SURFACE ELASTICITY MEASUREMENTS USING AN ATOMIC FORCE
MICROSCOPE.
Devecchio D; Bhushan B. p 4498-4505
NONINVASIVE PROBING OF HIGH FREQUENCY SIGNAL IN INTEGRATED CIRCUITS USING
ELECTROSTATIC FORCE MICROSCOPE.
Hong JW; Khim ZG; Hou AS; Park SI. p 4506-4510
IMPULSE EXCITATION APPARATUS TO MEASURE RESONANT FREQUENCIES, ELASTIC
MODULI, AND INTERNAL FRICTION AT ROOM AND HIGH TEMPERATURE.
Roebben G; Bollen B; Brebels A; Vanhumbeeck J; Vanderbiest O.
p 4511-4515
AN AC MICROCALORIMETER EMPLOYING A DIODE LASER AS A HEATER.
Marone MJ; Payne JE. p 4516-4520
NOVEL HIGH-TEMPERATURE, HIGH-VACUUM, ALL-METAL SAMPLE CELLS FOR
MICROCALORIMETRIC MEASUREMENTS OF SOLIDS.
Coker EN; Karge HG. p 4521-4524
FAST THICKNESS PROFILE MEASUREMENT OF A THIN FILM BY USING A LINE SCAN
CHARGE COUPLED DEVICE CAMERA.
Liang NY; Chan CK. p 4525-4530
MEASUREMENT OF 0.1 CM(2) SURFACE AREAS BY XENON ADSORPTION AT LIQUID
OXYGEN TEMPERATURE USING AN ADSORPTION APPARATUS WITH A
TEMPERATURE-COMPENSATED, DIFFERENTIAL TENSIMETER OF SYMMETRICAL DESIGN.
Suzuki I; Oosawa K. p 4531-4535
NOVEL NEEDLE MICROBALANCE FOR ADSORPTION STUDIES.
Bruschi L; Borghesani AF; Delfitto G; Mistura G. p 4536-4541
HIGH PRESSURE FLOW GRAVIMETRIC APPARATUS FOR SUPERCRITICAL FLUID
EXTRACTION STUDIES.
Jwayyed AM; Humayun R; Tomasko DL. p 4542-4548
A PHOTOELECTRON SPECTROMETER FOR K-SPACE MAPPING ABOVE THE FERMI LEVEL.
Greber T; Raetzo O; Kreutz TJ; Schwaller P; Deichmann W; Wetli E;
Osterwalder J. p 4549-4554
DETERMINATION OF FLUX IONIZATION FRACTION USING A QUARTZ CRYSTAL
MICROBALANCE AND A GRIDDED ENERGY ANALYZER IN AN IONIZED MAGNETRON
SPUTTERING SYSTEM.
Green KM; Hayden DB; Juliano DR; Ruzic DN. p 4555-4560
PIEZOELECTRICALLY ACTUATED DROPLET EJECTOR.
Percin G; Levin L; Khuriyakub BT. p 4561-4563
IN SITU STRESS MEASUREMENT APPARATUS FOR LIQUID APPLIED COATINGS.
Payne JA; Mccormick AV; Francis LF. p 4564-4568
LIQUID-TO-GAS DIFFERENTIAL PRESSURE TRANSMITTER WITH SMALL HYDROSTATIC
ERROR.
Mcwhirter JD; Crawford ME; Klein DE. p 4569-4571
AN ULTRAHIGH VACUUM SURFACE ANALYSIS INSTRUMENT INCORPORATING A FOURIER
TRANSFORM MASS SPECTROMETER AND A FOURIER TRANSFORM INFRARED SPECTROMETER.
Abdelrehim IM; Thornburg NA; Land DP. p 4572-4582
A MODIFIED STOPPED-FLOW APPARATUS FOR TIME-RESOLVED PROTEIN
PHOSPHORESCENCE.
Strambini GB; Puntoni A; Gonnelli M. p 4583-4587
HIGH PRESSURE CELL FOR SMALL-AND WIDE-ANGLE X-RAY SCATTERING.
Pressl K; Kriechbaum M; Steinhart M; Laggner P. p 4588-4592
MICROCHAMBER FOR OPTICAL OBSERVATION OF FREEZE-DRYING PHENOMENA.
Bayard J; Cleris H; Varnier S. p 4593-4595
DEMONSTRATION OF LOW TEMPERATURE RADIATIVE COOLER FOR FUTURE SPACE
MISSIONS.
Cushman GM; Mather JC; Fixsen DJ. p 4596-4599
INVESTIGATION OF VIOLIN MODE Q FOR WIRES OF VARIOUS MATERIALS.
Dawid DJ; Kawamura S. p 4600-4603
A NEW ROTATING SPARK GAP DESIGN.
Haddad A; Abdulmalek Z. p 4604-4608
THE OPTIMUM DYNAMIC PARAMETERS OF DIGITAL RATE METER ALGORITHMS.
Arandjelovic VD; Koturovic AM. p 4609-4611
DISTANCE MEASUREMENT METHOD USING THE TWO INTERMODE BEAT FREQUENCIES OF A
THREE-LONGITUDINAL MODE HE-NE LASER.
Eom IJ; Kim KC; Suh HS. p 4612-4614
ANALYSIS OF A PRESSURE SENSOR BASED ON AN ARRAY OF COLLECTOR-ASSISTED
FIELD-EMISSION TRIODES.
Nicolaescu D; Filip V; Okuyama F. p 4615-4620
AN INEXPENSIVE, LOW-ENERGY, IONIZED GAS SOURCE FOR MOLECULAR BEAM EPITAXY
APPLICATIONS.
Stumborg MF; Santiago F; Chu TK; Boulais KA. p 4621-4622
OPTOGALVANIC LASER DOPPLER VELOCIMETRY USING THE SELF-MIXING EFFECT OF CO2
LASER.
Choi JW; Kim YP; Kim YM. p 4623-4624
A COMBINED MASS GATE-ENERGY DISCRIMINATOR.
Becker I; Cheshnovsky O. p 4625-4626
MICROPHONE DETECTION OF LASER ABLATION.
Chae H; Park SM. p 4627-4628