REVIEW ARTICLE
Table-top soft x-ray lasers J. J. Rocca pp. 3799-3827
ARTICLES
OPTICS; ATOMS and MOLECULES; SPECTROSCOPY Frequency stabilized distributed feedback laser diode system at 1.323 µm using the modulated Zeeman effect Craig R. Schwarze and Julia H. Rentz pp. 3828-3831
Calibration of single-mode content of semiconductor diode laser emission A. Dinklage, Samir Solyman, and C. Wilke pp. 3832-3833
High precision free spectral range measurement using a phase modulated laser beam P. J. Manson pp. 3834-3839
Uncoated hollow taper as a simple optical funnel for laser delivery Ilko K. Ilev and Ronald W. Waynant pp. 3840-3843
Lower order blaze grating spectrometer of large diffraction angle Yu. S. Koshkin, E. E. Mukhin, G. T. Razdobarin, V. V. Semenov, A. N. Shilnikov, Yu. K. Mihailovskij, and L. I. Bakh pp. 3844-3846
A new instrument for measuring both the magnitude and angle of low level linear birefringence Baoliang Wang and Theodore C. Oakberg pp. 3847-3854
Performance of the grating-crystal monochromator of the ALOISA beamline at the Elettra Synchrotron L. Floreano, G. Naletto, D. Cvetko, R. Gotter, M. Malvezzi, L. Marassi, A. Morgante, A. Santaniello, A. Verdini, F. Tommasini, and G. Tondello pp. 3855-3864
Design and performance of the JAERI superconducting linac for high-power free-electron laser Masaru Sawamura, Ryoji Nagai, Nobuhiro Kikuzawa, Masayoshi Sugimoto, Nobuyuki Nishimori, and Eisuke J. Minehara pp. 3865-3868
Reducing loss of a hole-coupled resonator for a free-electron laser with partially reflecting meshes Xiaojian Shu, Yuanzhang Wang, Yunqing Jiang, and Yukun Huo pp. 3869-3871
Multipoint velocity interferometer system for any reflector Zeren Li, Ruchao Ma, Guanghua Chen, Jun Liu, and Jianquan Yao pp. 3872-3876
An improved instrument for measuring time-resolved lanthanide emission and resonance energy transfer Ming Xiao and Paul R. Selvin pp. 3877-3881
CHARGED PARTICLE SOURCES, OPTICS and ACCELERATION A simplified GaAs polarized electron source H. M. Al-Khateeb, B. G. Birdsey, T. C. Bowen, A. S. Green, M. E. Johnston, and T. J. Gay pp. 3882-3885
A low stray light, high current, low energy electron source M. Adelt, R. Körber, W. Drachsel, and H.-J. Freund pp. 3886-3888
An improved method for detecting hot spots in field emission cathode arrays Yi Wei, Bruce G. Smith, and Babu R. Chalamala pp. 3889-3891
High-resolution pulsed field ionization photoelectron-photoion coincidence spectroscopy using synchrotron radiation G. K. Jarvis, Karl-Michael Weitzel, Marcus Malow, Tomas Baer, Y. Song, and C. Y. Ng pp. 3892-3906
Electron impact ionization in a microion trap mass spectrometer Oleg Kornienko, Peter T. A. Reilly, William B. Whitten, and J. Michael Ramsey pp. 3907-3909
A combined time-of-flight and electrostatic analyzer for low-energy ion scattering A. W. Denier van der Gon, M. A. Reijme, R. F. Rumphorst, A. J. H. Maas, and H. H. Brongersma pp. 3910-3914
A method for calculating the average solid angle subtended by a circular disk from uniformly distributed points within a coaxial circular plane Stanislaw Tryka pp. 3915-3920
NUCLEAR PHYSICS, FUSION and PLASMAS A reflectometer for fluctuation and correlation studies on the Joint European Torus tokamak G. D. Conway, G. Vayakis, J. A. Fessey, and D. V. Bartlett pp. 3921-3929
Ion energy spectra analyzers for magnetized plasma I. N. Churkin, V. I. Volosov, and A. G. Steshov pp. 3930-3933
Neutral helium beam probe Rezwanul Karim pp. 3934-3937
BASIC PHENOMENA Portable oil bath for high-accuracy resistance transfer and maintenance Fuyuhiko Shiota pp. 3938-3941
A capacitive two-phase flow slug detection system A. Teyssedou and P. Tye pp. 3942-3948
Gas flow meter using a positive temperature coefficient thermistor as the sensor Suman Chatterjee, Kamalendu Sengupta, and Himadri S. Maiti pp. 3949-3954
MICROSCOPY and IMAGING Dynamic force distance control suited to various probes for scanning near-field optical microscopy A. Naber, H.-J. Maas, K. Razavi, and U. C. Fischer pp. 3955-3961
Detection of surface-plasmon evanescent fields using a metallic probe tip covered with fluorescence T. Wakamatsu, T. Nakano, K. Shinbo, K. Kato, and F. Kaneko pp. 3962-3966
Calibration of rectangular atomic force microscope cantilevers John E. Sader, James W. M. Chon, and Paul Mulvaney pp. 3967-3969
Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy A.-D. Müller, F. Müller, M. Hietschold, F. Demming, J. Jersch, and K. Dickmann pp. 3970-3972
Photoemission electron microscope for the study of magnetic materials Simone Anders, Howard A. Padmore, Robert M. Duarte, Timothy Renner, Thomas Stammler, Andreas Scholl, Michael R. Scheinfein, Joachim Stöhr, Laurent Séve, and Boris Sinkovic pp. 3973-3981
Nanotip array photoimprint lithography Thuc H. Dam and Paul Pantano pp. 3982-3986
Tomography of the fast electron bremsstrahlung emission during lower hybrid current drive on TORE SUPRA Yves Peysson and Frédéric Imbeaux pp. 3987-4007
CONDENSED MATTER; MATERIALS Experimental developments to obtain real-time x-ray diffraction measurements in plate impact experiments Y. M. Gupta, K. A. Zimmerman, P. A. Rigg, E. B. Zaretsky, D. M. Savage, and P. M. Bellamy pp. 4008-4014
A small-angle neutron scattering cell for the study of supercritical fluids at elevated pressure and high temperature: A study of heavy water M. Bonetti, J. P. Ambroise, and P. Calmettes pp. 4015-4019
A spectroscopic method to measure the spectral emissivity of semi-transparent materials up to high temperature O. Rozenbaum, D. De Sousa Meneses, Y. Auger, S. Chermanne, and P. Echegut pp. 4020-4025
A novel bulge-testing setup for rectangular free-standing thin films A. J. Kalkman, A. H. Verbruggen, G. C. A. M. Janssen, and F. H. Groen pp. 4026-4031
Surface photovoltage measurements in liquids S. Bastide, D. Gal, David Cahen, and L. Kronik pp. 4032-4036
New apparatus with double supersonic molecular beams for epitaxial growth and surface reaction studies M. Ohashi, M. Ozeki, and J. Cui pp. 4037-4043
Minority carrier lifetime scan map in crystalline silicon wafers J. Gervais, O. Palais, L. Clerc, and S. Martinuzzi pp. 4044-4046
Voltage monitoring device for characterization of semiconducting and superconducting circuits Y. Christoforou and D. G. Xenikos pp. 4047-4050
An instrument for the collection of simultaneous small and wide angle x-ray scattering and stress–strain data during deformation of polymers at high strain rates using synchrotron radiation sources D. J. Hughes, A. Mahendrasingam, C. Martin, W. B. Oatway, E. L. Heeley, S. J. Bingham, and W. Fuller pp. 4051-4054
Very high sensitivity ac capacitance bridge for the dielectric study of molecular solids at low temperatures S. Pilla, J. A. Hamida, and N. S. Sullivan pp. 4055-4058
Inductive method for investigation of ferromagnetic properties of materials under pressure Yuri A. Timofeev, Ho-kwang Mao, Viktor V. Struzhkin, and Russell J. Hemley pp. 4059-4061
BIOLOGY and MEDICINE Designs for an asymmetric gradient set and a compact superconducting magnet for neural magnetic resonance imaging Stuart Crozier, Kurt Luescher, Gavin Hinds, Wolfgang U. Roffmann, and David M. Doddrell pp. 4062-4066
Time-resolved spectrofluorometer for clinical tissue characterization during endoscopy Thomas Glanzmann, Jean-Pierre Ballini, Hubert van den Bergh, and Georges Wagnières pp. 4067-4077
GRAVITY; GEOPHYSICS; ASTRONOMY and ASTROPHYSICS Determination of the dynamic response of a nitric oxide detector Kevin L. Civerolo, Jeffrey W. Stehr, and Russell R. Dickerson pp. 4078-4080
Dissipation of mechanical energy in fused silica fibers Andri M. Gretarsson and Gregory M. Harry pp. 4081-4087
Design and performance of a portable 3He cryogenic system for ground based instrumentation J. Verveer, N. Rando, S. Andersson, P. Gondoin, A. Peacock, and B. Collaudin pp. 4088-4096
Design and performance of a dual polarizing detector system for broadband astronomical spectroscopy at submillimeter wavelengths D. A. Naylor, B. G. Gom, P. A. R. Ade, and J. E. Davis pp. 4097-4109
GENERAL INSTRUMENTS Liquid helium transfer using a mass-flow controller Yusaku Fujii, Yukinobu Miki, Fuyuhiko Shiota, and Ritsu Watanabe pp. 4110-4113